Integrated Photonics Test Products
Keysight provides test solutions for fast and efficient integrated and silicon photonics wafer and chip level test consisting of:
- Wavelength and polarization dependent optical and electro-optical measurements from 1240-1640nm with
- Photonic Application Suite
- Tunable Lasers
- Polarization Synthesizers
- Optical Power Meters and Source Measure Units (standalone and modular)
- Optical Signal Conditioning with Optical Switches and Attenuators
- High frequency electro-optics measurements up to 110GHz with
- Wafer probing with FormFactor Silicon Photonics CM300xi probe station
- Test Automation with:
- Test recipes ad measurement plan definition and execution with KS8400A Keysight Test Automation Platform (TAP)
- Automated wafer probe station control with N7700210C Wafer Prober TAP Plug-In
- Automated E/O and O/E LCA measurement with N4370P01A LCA TAP Plug-In
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KS8400A 測試自動化平台開發商系統
KS8400A 測試自動化平台開發商系統
- 強大、靈活和可擴展的測試排序軟體
- 時間分析儀可極致加快測試計劃速度
- 結果檢視器可以圖形方式比較並分析測試計劃資料
- GUI 簡化測試計劃建立和故障排除
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N7700210C 晶圓探測器 TAP 外掛軟體
N7700210C 晶圓探測器 TAP 外掛軟體
- 可輕鬆將晶圓探測器控制功能整合到 TAP 測試序列中
- 自動進行裝置步進，以及光學和電子探棒定位與校準
- 支援陣列/單一光纖探棒、邊緣與表面耦合、射頻/直流探棒
