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元件建模與特性分析產品

我們的產品和主要解決方案可為最尖端的 CMOS 和複合式半導體元件提供建模和特性分析功能。是德科技是業界唯一提供完整的端對端建模解決方案的廠商,從自動化量測、準確的元件模型萃取、完整檢驗,到最後的製程設計套件(PDK)驗證。是德科技專業工程師和先進實驗室提供並支援完整的建模服務。我們提供下列的關鍵元件建模和特性分析 EDA 軟體和硬體件解決方案。

元件建模產品的主要優點

  • 積體電路特性化及分析程式(IC-CAP)是符合產業標準的通用型半導體元件建模套件,方便使用者可依需求自行編寫程式
  • 模型建構程式(MBP)是完整的矽晶統包式元件建模軟體
  • 模型品質保證(MQA)是符合產業標準的 SPICE 模型簽發和驗收軟體
  • WaferPro Express 支援晶圓級量測與程控測試軟體,可用於各種不同的儀器與晶圓探棒
  • 先進低頻雜訊分析儀(A-LFNA)支援晶圓上量測,還可針對閃變雜訊和隨機電報雜訊進行分析

深入了解元件建模與特性分析

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設計與模擬工作流程的未來趨勢
此研究發現,企業有極大的機會和可能性,可更有效率地在電子產品開發生命週期的設計和模擬階段執行任務,進而縮短產品上市時程。資料移動和工具整合,是目前導致產品開發大幅延盪的最大問題。幾乎所有受訪公司都嘗試利用並比較設計模擬資料,以便測試結果。

應用手冊 2019-04-02

Low-Frequency Noise Measurements with the E4727A and Their Applications
This application note covers noise basics (1/f and white), applications of noise measurements and analysis, and how noise measurement challenges are addressed by the E4727A A-LFNA.

應用手冊 2016-04-28

PDF PDF 2.39 MB
Enabling Noise Measurements on Magnetic Sensors
This document describes how to use the Keysight E4727A Advanced Low-Frequency Noise Analyzer to simplify noise measurements on magnetic sensors.

應用手冊 2016-03-24

Statistical Modeling in MBP
This application note introduces the statistical module in Model Builder Program (MBP). The module’s contents, including data format, plot configuration, Monte Carlo (MC) analysis, extraction flow, and IMV plot are covered. Knowledge Center login required.

應用手冊 2011-12-01

Mismatch Modeling in MBP
This application note introduces the basic components of Model Builder Program’s (MBP’s) mismatch module. The steps to run the built-in extraction flow, and how to configure and plot an IMV graph in MBP are also demonstrated. Knowledge Center login required.

應用手冊 2011-12-01

Loading Multi-Die Data in MBP
This application note describes how to set up the script-based environment so that MBP can load and utilize ET data. Knowledge Center login required.

應用手冊 2011-10-01

Lib Test in Model Quality Assurance
This application note describes how to run quick checking on the model libraries by using the Lib Test feature in Model Quality Assurance (MQA). Knowledge Center login required.

應用手冊 2011-09-01

TMI Aging Model Application
This application note describes how to implement a TSMC Modeling Interface (TMI) aging model in Model Builder Program (MBP). Knowledge Center login required.

應用手冊 2011-08-01

Batch Mode Application
This application note describes how to batch run multiple tasks in Model Quality Assurance (MQA). Knowledge Center login required.

應用手冊 2011-08-01

Adding Additional Instance Parameters
This application note describes how to add additional instance parameters in Model Builder Program (MBP). Knowledge Center login required.

應用手冊 2011-08-01

Optimization Weight Setting
This application note describes how to set weight in Model Builder Program (MBP). Knowledge Center login required.

應用手冊 2011-08-01

Binned Model Generation and Tweaking
This application note describes how to generate and tweak binning models in Model Builder Program (MBP). Knowledge Center login required.

應用手冊 2011-07-01

Multiple Simulations in MBP
This application note describes how to compare two or more different models in Model Builder Program (MBP). Knowledge Center login required.

應用手冊 2011-07-01

Implementing MOSRA Models in MBP
This application note describes how to implement a MOS reliability analysis (MOSRA) model in Model Builder Program (MBP). Knowledge Center login required.

應用手冊 2011-07-01

Implementing Verilog-A Models in MBP
This application note describes how to implement Verilog-A models in Model Builder Program (MBP). Knowledge Center login required.

應用手冊 2011-07-01

Advanced Graph Export
This application note describes how to customize the report to be exported in Model Builder Program (MBP). Knowledge Center login required.

應用手冊 2011-07-01

Generate and Tweak Corner Models
This application note describes how to generate and tweak corner models in Model Builder Program (MBP). Knowledge Center login required.

應用手冊 2011-07-01

Model QA with Electrical Test Data
This application note describes how to run a QA on models with electrical test data in Model Quality Assurance (MQA). Knowledge Center login required.

應用手冊 2011-05-01

Passive Subcircuit Model QA
This application note describes how to run passive subcircuit (subckt) model quality assurance (QA) in Model Quality Assurance (MQA). Knowledge Center login required.

應用手冊 2011-05-01

Generate MOS Model Parameter Table
This application note describes how to use Lib Explorer to generate a MOS model parameter table. Knowledge Center login required.

應用手冊 2011-05-01

Parameter Boundary in MBP
This application note introduces the different types of parameter boundaries defined in Model Builder Program (MBP). Knowledge Center login required.

應用手冊 2011-05-01

Calling an External Simulator
This application note describes how to call an external simulator for the simulation in Model Builder program (MBP). Knowledge Center login required.

應用手冊 2011-05-01

Merging Two Projects into One Report
This application note describes how to generate documents from various data sources by taking advantage of the Model Quality Assurance (MQA) reporting function and utilities. As an example, it shows how to merge two MQA project results into one report. Knowledge Center login required.

應用手冊 2011-04-01

Building an Excel Table with Perl
This application note describes how to build a user-defined Excel table with Perl utilizing a simple and fast method. Knowledge Center login required.

應用手冊 2011-04-01

Automated Measurement with IC-CAP
This application note describes a seamless solution for automated measurement and parameter extraction with Keysight IC-CAP

應用手冊 2011-01-10

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