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聯絡是德專家

元件建模與特性分析產品

我們的產品和主要解決方案可為最尖端的 CMOS 和複合式半導體元件提供建模和特性分析功能。是德科技是業界唯一提供完整的端對端建模解決方案的廠商,從自動化量測、準確的元件模型萃取、完整檢驗,到最後的製程設計套件(PDK)驗證。是德科技專業工程師和先進實驗室提供並支援完整的建模服務。我們提供下列的關鍵元件建模和特性分析 EDA 軟體和硬體件解決方案。

元件建模產品的主要優點

  • 積體電路特性化及分析程式(IC-CAP)是符合產業標準的通用型半導體元件建模套件,方便使用者可依需求自行編寫程式
  • 模型建構程式(MBP)是完整的矽晶統包式元件建模軟體
  • 模型品質保證(MQA)是符合產業標準的 SPICE 模型簽發和驗收軟體
  • WaferPro Express 支援晶圓級量測與程控測試軟體,可用於各種不同的儀器與晶圓探棒
  • 先進低頻雜訊分析儀(A-LFNA)支援晶圓上量測,還可針對閃變雜訊和隨機電報雜訊進行分析

深入了解元件建模與特性分析

1-25 / 188

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The Case for Integrated Design Software
Design World article presenting the case for integrated design software by Lee Teschler.

專文 2019-10-22

Keysight Technologies Enables Rapid Product Development with PathWave Test 2020 Software Suite
Keysight announces the PathWave Test 2020 software suite, which delivers an integrated experience for leading electronic manufacturers to accelerate time-to-market of their digital and wireless platforms and products.

新聞資料 2019-10-22

RF and Microwave Industry-Ready Student Certification Program
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Keysight EEsof EDA software design tools and Keysight instruments.

型錄 2019-10-04

PDF PDF 1.07 MB
IC-CAP 2020 Update 1.0 版本說明
IC-CAP 2020 Update 1.0 版本說明

版本須知 2019-09-13

RF GaN Device Models and Extraction Techniques
This presentation was recorded at IMS 2019. The Workshop covers the market trends, technology and challenges in using Gallium Nitride (GaN) devices.

基本展示 2019-08-30

PathWave 設計軟體
複雜的設計帶來全新的挑戰。設計人員需花上數小時進行設定和模擬。成堆的資料等著量測和分析。工程師必須建立解決方法,來連接多個設計工具。 無線標準同時也在快速進化。為了滿足現代科技的強烈需求,設計人員需要新的方法。

型錄 2019-07-30

PDF PDF 17.38 MB
IIT Kanpur Develops ASM-HEMT Model for GaN Transistors Using Parametric and Device Characterization
The India Institute of Technology Kanpur creates an accurate and simple compact SPICE model and introduces an industry-grade model for power electronics and RF applications.

案例研究 2019-07-10

PDF PDF 1.90 MB
PathWave Design Software
Accelerate your design cycle with integrated design and simulation software. Know your performance under simulated real-world conditions before you build.

型錄 2019-07-01

PDF PDF 13.23 MB
Transforming Engineering Education with Cutting-Edge Keysight Labs
Keysight is committed to continue with innovation that will enable researchers, educators, and students.

案例研究 2019-06-25

PDF PDF 2.03 MB
Keysight Technologies Accelerates Design Workflows with New PathWave Design 2020 Software Suite
Keysight announces PathWave Design 2020, which includes the latest releases of Keysight's electronic design automation software to accelerate design workflows for radio frequency (RF) and microwave, 5G, and automotive design engineers.

新聞資料 2019-06-03

專為新興公司打造的 Keysight EDA 軟體「新創專案」
專為新興公司打造的 Keysight EDA 軟體「新創專案」是一項優惠專案。

促銷資料 2019-05-22

Keysight Technologies EDA Software "Startup Program" for Young Companies
The Keysight EDA Software "Startup Program" for Young Companies is a promotion.

促銷資料 2019-05-22

MBP 2019 文件
模型建構程式(MBP)2019 產品文件。

參考指南 2019-04-18

MBP 2019 版本說明
模型建構程式(MBP)2019 產品版本說明。

版本須知 2019-04-15

Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

新聞簡訊 2019-04-09

Improved Data Sharing Across Product Development Workflow Would Improve Time to Market
Keysight Survey Reveals Improved Data Sharing Across the Entire Product Development Workflow Would Improve Time to Market for Electronic Devices.

新聞資料 2019-04-08

設計與模擬工作流程的未來趨勢
此研究發現,企業有極大的機會和可能性,可更有效率地在電子產品開發生命週期的設計和模擬階段執行任務,進而縮短產品上市時程。資料移動和工具整合,是目前導致產品開發大幅延盪的最大問題。幾乎所有受訪公司都嘗試利用並比較設計模擬資料,以便測試結果。

應用手冊 2019-04-02

WaferPro Express Software
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

型錄 2019-02-28

PDF PDF 2.89 MB
MQA 2019 版本說明
模型品質保證(MQA)2019 產品版本說明。

版本須知 2019-02-07

MQA 2019 文件
模型品質保證(MQA)2019 產品文件。

參考指南 2019-02-07

IC-CAP Device Modeling Software
This Technical Overview presents Keysight Technologies IC-CAP Device Modeling Software. The IC-CAP platform enables the measurement, characterization and modeling model parameter extraction of both discrete and on-wafer devices.

技術總覽 2018-12-03

Model Quality Assurance (MQA)
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

型錄 2018-11-26

PDF PDF 3.46 MB
E4727A Advanced Low-Frequency Noise Analyzer
The E4727A Advanced Low-Frequency Noise Analyzer supports wafer mapping measurement and data analysis of flicker noise and random telegraph noise.

產品型錄 2018-09-28

Align wafer probes and create a wafer map – WMS Series Part 4 of 6
In this video, we demonstrate how to align a wafer to the reference plane of our probing system using the auto align feature in Velox. We will then generate a wafer map.

基本展示 2018-05-09

Perform on-wafer RF calibration – WMS Series Part 5 of 6
In this video, we demonstrate an on wafer network analyzer calibration to 50 GHz.

基本展示 2018-05-09

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