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聯絡是德專家

掃描電子顯微鏡

是德科技自豪地發表全球首見的小型場發射掃描電子顯微鏡(FE-SEM)。8500B 系統專為低電壓、高解析度成像應用而設計,採用定量能量色散光譜(EDS)進行進階元素分析。

研究資源

  • U9320B 8500B Field Emission Scanning Electron Microscope (FE-SEM) [已停產] U9320B 8500B Field Emission Scanning Electron Microscope (FE-SEM) [已停產] 

    U9320B 8500B Field Emission Scanning Electron Microscope (FE-SEM) [已停產]

    The remarkably compact Keysight 8500B field-emission scanning electron microscope (FE-SEM) has been optimized for low-voltage imaging, extremely high surface contrast, and resolution.