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欲對半導體元件執行準確的 DC/CV（和射頻）統計建模，您需收集不同晶圓在各種溫度下進行量測所得到的大量資料。Keysight IC-CAP WaferPro 作為統包式 DC/CV 與射頻自動化分析解決方案，可協助建模和元件工程師，在不同溫度下實現更有效率的晶圓上量測。此突破性解決方案基於 IC-CAP 建模軟體，可有效率控制 DC/CV 分析儀、網路分析儀、探測器、切換矩陣和溫度吸盤，以及功能強大的是德科技 407x 和 408x 系列 參數測試儀。

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更多關於 IC-CAP 元件建模軟體的詳細資訊，請瀏覽 IC-CAP 元件建模軟體。

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