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在今日的光學研發實驗室與製造廠房中，分析光學信號極化特性的測試與量測功能是不可或缺的。Keysight N778x 極化分析與控制系列提供高速測試儀器，可進行光學元件及子系統的高效能特性分析與驗證。

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光學極化解決方案

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N7781C
Keysight N7781C 是外形小巧的高速偏振分析儀，可用於對光信號進行偏振特性分析。 包括龐加萊球（Stokes 參數）的偏振狀態（SOP）呈現。 
入門價  
Keysight N7781C 是外形小巧的高速偏振分析儀，可用於對光信號進行偏振特性分析。 包括龐加萊球（Stokes 參數）的偏振狀態（SOP）呈現。
N7785C
The Keysight Technologies N7785C is a high-speed synchronous scrambler that can repeatably switch through a series of states of polarization (SOP) with both input and output triggering functions. 
入門價  
The Keysight Technologies N7785C is a high-speed synchronous scrambler that can repeatably switch through a series of states of polarization (SOP) with both input and output triggering functions.
N7786C
The Keysight N7786C is a high-speed lithium-niobate based polarization controller with built-in polarimeter for monitoring and feedback to set and stabilize sequences of chosen output polarization states. 
入門價  
The Keysight N7786C is a high-speed lithium-niobate based polarization controller with built-in polarimeter for monitoring and feedback to set and stabilize sequences of chosen output polarization states.
N7788C
N7788C 將偏振計和偏振控制器相結合可在實驗室中靈活使用，並可透過單次掃描演算法與是德科技可調式雷射，對光學元件和光纖進行快速光譜 DGD/PMD 和 PDL 量測。 
入門價  
N7788C 將偏振計和偏振控制器相結合可在實驗室中靈活使用，並可透過單次掃描演算法與是德科技可調式雷射，對光學元件和光纖進行快速光譜 DGD/PMD 和 PDL 量測。
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Featured Resources for the 光學極化解決方案

Data Sheets 2019.11.18

N7786B Polarization Synthesizer

N7786B Polarization Synthesizer

This data sheet describes the N7786B Polarization Synthesizer. The N7786B contains a high-speed Lithium-Niobate based polarization controller and a polarization analyzer plus a microcontroller-based driving circuitry.

2019.11.18

Brochures 2018.03.07

Lightwave Catalog: Test & Measurement Networks and Data Centers

Lightwave Catalog: Test & Measurement Networks and Data Centers

The catalog for high-performance optical T&M solutions provides information on test applications and test equipment for core fiber networks and data centers.

2018.03.07

Application Notes 2021.11.28

Wafer and Chip-Level Optical Test

Wafer and Chip-Level Optical Test

See how the N7700 Lambda Scan test system supports integrated photonics with polarization alignment for optical testing of wafers and chips.

2021.11.28

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