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適用於 PCBA 的 i3070 系列 6 電路測試系統

Keysight i3070 系列 6 電路測試（ICT）系統建立在經實證的技術基礎上，且提供歷久不衰的軟體、硬體和可程控性，可大幅提升測試效率。 I3070 系列 6 ICT 測試儀支援各種不同的印刷電路板組裝（PCBA）尺寸，可因應物聯網、5G，以及汽車和能源等諸多應用的測試需求。 i3070 採獨家設計，可顯著縮短量測電路和待測物之間的信號路徑，以便將寄生電容效應降到最低，進而提高對串擾的抗干擾性、消除雜散信號的耦合效應，進而提供一致且穩定的量測結果。 系列 6 完全向後相容於先前的系統，方便您執行可重複的量測。

i3070 系列 6 ICT 具下列出色特性：

  • 將 Silicon Nails 測試/邊界掃描的測試效率提高 40% 以上，測試多數 PCBA 時，整體速度加快了 6% 以上
  • 100% 的向後相容性，可全面減少安裝時的停機時間，而且原始碼完全相容
  • 具備經認證的機器對機器（M2M）功能，例如支援 IPC 連網工廠交換（IPC-CFX）和 IPC-HERMES-9852 標準，讓您能提高工作效率、獲得更完整的測試資料和更短的響應時間，進而降低營運成本
  • 現代化軟體授權方式，讓授權成本變得更公開透明；此外，企業可集中管理授權，並依據生產需求來擴充授權規模

全新的 i3070 系列 6 電路測試平台提供可轉移的測試功能，且加入先進的工業 4.0 技術，以協助頂尖的印刷電路組裝製造商提高良率、加快量測速率，進而獲得同級產品中最出色的運作效率。

如需經濟型且具數位功能的電路測試系統，請查看是德科技最新的 i1000D 系統。

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H7230A-510 i3070 Boundary Scan Concepts and Applications

Learn the advanced topics for developing Boundary-Scan Test applications on the i3070 in-circuit board tester. This class covers various concepts in boundary-scan testing, such as serial programming and testing non-boundary-scan devices using boundary-scan. In addition to testing development, various debugging techniques are also detailed. The class concludes with a "best practices" section.

H7230A-516 i3070 Advanced Digital

Learn the advanced topics for developing Digital Test applications on the i3070 in-circuit board tester. This class builds upon the fundamentals of digital vector control language (VCL) and pattern capture format (PCF) that were presented in the Fundamentals classes. The attendee will learn about erase, program, and verification techniques for parallel memory, serial memory, and devices.

H7230A #500 i3070 Family Multiplexed User Fundamentals Class I

Learn the basics needed to develop a Board Test program with the i3070 Multiplexed Board Test system. Design, develop, turn-on and debug tests. Typically, Class I and II are taken consecutively.

H7230A #555 i3070 Family Multiplexed User Fundamentals Class II

Enhanced training to take the programmer beyond the basics into custom test generation. Get more performance and coverage from your i3070. Typically, Class I and II are taken consecutively.

H7230A #514 i3070 UnMuxed User Fundamentals I

In this course, test developers will learn the standard tools that are readily available on the i3070.

H7230A #515 i3070 UnMuxed User Fundamentals II

In this course, test developers learn to customize tests, generate custom test models and receive an introduction to many of the optional test tools available on the i3070.

H7230A #520 i3070 Family Production Support Training

Learn to support the 3070 on the production line - turn-on and debug tests developed by other programmers, run testhead diagnostics and interpret the results, isolate faults (testhead, fixture, test program, printed circuit board...)

H7230A #550 3070 Family Maintenance Fundamentals

Gain an understanding of the Keysight 3070 service documentation, Confirmation, and Diagnostics, System-level card operation, power, analog, digital, and control subsystem operation, and troubleshooting.

H7230A #530 i3070 In-Line Production Support Training

New production line Technicians and Engineers supporting i3070 In-Line testers on the factory floor. The participant is trained on operational requirements and best practices to set up, run, and maintain automated i3070 In-Line testers. The participant is also instructed on the basics of i3070 hardware, software to maintain production and support implementation of product ECO.

i3070 電路測試系統精選資源

Application Notes 2023.01.04

Essential Steps for Practical Bead Probe Implementation

Essential Steps for Practical Bead Probe Implementation

This document summarizes the bead probe handbook and other relevant white papers that describe effective methods for bead probe implementation. This paper shows how to use the formula to fine-tune the parameters to achieve optimal bead heights and emphasizes the importance of considering the impact of various variables such as bead height, length, and aperture size, as well as probe force, and selecting the appropriate probe head style for different types of applications.

2023.01.04

Application Notes 2023.01.05

Practical Bead Probe Implementation Strategy

Practical Bead Probe Implementation Strategy

This application note demonstrated how you could improve the test coverage on small and complex PCBAs by adopting the bead probe handbook's strategy. This paper showcased the different experiments on the stencil aperture and fixture probe style to validate the optimum parameters.

2023.01.05

Application Notes 2022.09.23

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

The i3070 4-module Inline In-Circuit Tester is capable of meeting the stated board size requirements with the i3070 10.20p software version. This application note describes how to change some of the key parameters within the software to create the fixturing and test programs to accommodate a larger PCBA board requirement.

2022.09.23

Case Studies 2022.07.21

X1149 Brings Faster Testing for Server Boards

X1149 Brings Faster Testing for Server Boards

ICT (In-Circuit Testing) is well-known for its ability to provide a quick and comprehensive analysis of the PCBA's components and interconnectivity. However, ICT alone may not be sufficient because high-speed PCBA testing may necessitate a different approach. In this case study, we demonstrate how we assisted one of the world's largest original design manufacturers (ODMs) in improving the test process for their high-speed PCBA products.

2022.07.21

Application Notes 2022.07.05

Test Program Migration to 10.x software

Test Program Migration to 10.x software

How to use system variable to minimize the effort on migrating the existing test program to run on i3070 software version 10.x or latest

2022.07.05

Application Notes 2022.04.25

Fixture Reusability Consideration From In-line to Offline

Fixture Reusability Consideration From In-line to Offline

This application note describes the differences between the i3070 Series 5 inline 4 module test system (E9986E) fixture and the offline 4 module test system fixture, as well as the fixture reusability considerations.

2022.04.25

Case Studies 2022.11.10

10% Increase in ADAS PCBA Testing Throughput

10% Increase in ADAS PCBA Testing Throughput

Automotive electronics manufacturers must be prepared to address new test challenges efficiently and effectively as advanced driver assistance systems (ADAS) technology advances. This case study shows how an automotive electronics manufacturer used the Keysight in-line 4 module ICT and PathWave Manufacturing Analytics Software to cut down on labor-intensive tasks and increase test throughput.

2022.11.10

Application Notes 2021.08.04

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

The built-in bypass link conveyor in In-Circuit tester saves you the floor space and easy to setup at the manufacturing floor.

2021.08.04

Application Notes 2023.05.04

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

The backbone of Industry 4.0 applications is machine to machine communication. Transportation of information between machines and systems or machines to machines enables decentralized decision making. The challenge with machine-to-machine communication is that there was no standard “language”, each machine had its own communication protocols. IPC-CFX is an electronics manufacturing industry developed standard to address this challenge. IPC-CFX simplifies and standardizes machine to machine communication while also facilitating machine to business/business to machine solutions. Keysight’s i3070 In-Circuit test system supports IPC-CFX, as well as other communication protocols such as MQTT, OPC-UA and Panasonic’s iLNB.

2023.05.04

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