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ATE 系統電源供應器

以專用於自動化測試的電源供應器，縮短整合與測試時間

Keysight Power System - ATE System Power Supplies

縮短整合時間，加快測試速度

50 多年來，是德科技自動化測試設備（ATE）電源供應器持續改變工程師驗證設計、了解問題和確保產品品質的方式。是德科技可程控 ATE 系統電源供應器採用輕巧設計，可輕鬆整合至任何系統。是德科技電源供應器具備現代化介面、LXI-core 功能和 SCPI 語言，助您輕鬆更新測試程式。以快速指令處理和趨穩時間，縮短測試時間。

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Power supply configuration

最熱門的 ATE 電源供應器，可提供最佳的系統支援

  • 透過 Keysight N5700 和 N8700 系列，實現出色效能和簡單操作。採用輕巧設計，讓整合變得更容易。
  • 善用最熱門的 ATE N6700 系列模組化電源供應器，輕鬆滿足您的測試需求。1U 高主機可提供多達四路輸出。以單一電源模組驅動每一輸出 — 藉由選擇模組來新增或修正輸出，以滿足您的測試計畫。
  • 是德科技最先進的 N6900 和 N7900 電源供應器系列，提供每路輸出 1000 或 2000 W 功率。選配的耗散器可提供與雙極電源供應器類似的完整兩象限操作。

搜尋符合您需求的系列

選擇適合您系統的功率和效能等級

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查看所有系列

對您的 ATE 系統電源供應器進行整合與配置

身為測試系統工程師，您需面對日益更新的驗證需求，因此您的測試計畫也需不斷修正。克服這些挑戰並非易事，但有許多方式能確保系統電源供應器發揮最大效用。

Four Tips for Integrating and Using an ATE System Power Supply

Keysight ATE System Power Supply eBook

擴充 ATE 系統電源供應器的功能

BenchVue 軟體

BenchVue 軟體

藉由使用 BenchVue 軟體，輕鬆地控制儀器並簡化自動化程序

14585A 軟體控制 N7900 系列 PS

14585A 控制與分析

建立電源任意波形、記錄，並分析電源波形 — 支援 N6705C、N7900 以及 RP7900。

精選資源

Solution Briefs 2024.01.16

Custom RP7900 Rack Up to 1500 V / 720 A / 240 kW

Custom RP7900 Rack Up to 1500 V / 720 A / 240 kW

Our custom power supply rack offers a reliable and feature-rich solution for a wide range of applications. With its exceptional transient response, battery emulation and test capabilities, and the ability to test DC-DC converters, our power supply rack provides a robust test platform.

2024.01.16

eBooks 2023.07.20

4 Tips for Integrating and Using an ATE System Power Supply

4 Tips for Integrating and Using an ATE System Power Supply

Get the most out of your ATE system power supply. Tips include rack integration, DUT protection, and understanding output characteristics.

2023.07.20

Application Notes 2022.04.19

Optimize Power Source Integrity Under Large Load Transients

Optimize Power Source Integrity Under Large Load Transients

Today’s integrated circuits are operating faster than ever. The increased operating speed can lead to highly dynamic power demand from the power supply, which poses a challenge during testing when you source power using programmable power supplies. The high-speed current waveforms can lead to voltage drops at the integrated circuit. If it is severe enough, the voltage drop can reset the microprocessor or cause anomalies in your test results. This application note explains why this voltage drop occurs and offers several ways to achieve the lowest possible voltage drop by selecting optimal load leads and power supplies and using local bypassing.

2022.04.19

Application Notes 2015.02.14

Mastering Your High-Power Test Applications

Mastering Your High-Power Test Applications

Read these 5 tips to help you achieve success for a wide variety of high-power test applications using a DC power supply.

2015.02.14

Application Notes 2017.11.30

Trends in Programmable Power System DC Power Supplies

Trends in Programmable Power System DC Power Supplies

Trends in programmable DC power supplies continue to change. See how the N5700 Series power supplies up to 1500 W helps you stay up to date in a variety of industries.

2017.11.30

Application Notes 2017.11.30

Life Testing and Durability Test Systems

Life Testing and Durability Test Systems

What is durability test? See why managing high-power DC requirements for new product life and durability testing (life testing) is critical in competitive markets.

2017.11.30

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