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聯絡是德專家

EMI/EMC、相位雜訊、實體層測試系列

EMI/EMC 解決方案

  • 是德為您提供 EMI 量測解決方案,包括先期認證測試、EMC 診斷和完整的相容性測試
  • 相位雜訊量測解決方案
  • 靈活地測試 VCO、DRO、晶體振盪器、合成器、放大器以及轉換器,並量測連續波/脈衝和雜波信號
  • 信號源分析儀 — 提供全球最快的測試速率、對高頻率信號源的 VCO 或其它類型進行特性分析的最佳可用性,以及對高速資料通訊系統中的時脈抖動評估

實體層測試系統

  • 基於向量網路分析儀和時域反射計的系統,可因應高速數位設計中的信號完整性挑戰

相關軟體產品

  • N1930B Physical Layer Test System N19305B PLTS Advanced Calibration 

    N19305B PLTS Advanced Calibration

    • PLTS N19305B extends the N19301B base product to perform advanced calibration techniques such as Automatic Fixture Removal (AFR)

  • N1930B Physical Layer Test System N1930B 實體層測試系統(PLTS)2020 軟體 

    N1930B 實體層測試系統(PLTS)2020 軟體

    • PAM-4 眼圖
    • 通道操作邊限
    • MATLAB 相容性
    • 多通道進階眼圖
    • Hot TDR 量測

  • N1930B Physical Layer Test System N19303B PLTS Measurement and Calibration 

    N19303B PLTS Measurement and Calibration

    • PLTS N19303B extends the N19301B base product to control, calibrate and measure with Vector Network Analyzers or Time Domain Reflectometers

  • N1930B Physical Layer Test System N19307B PLTS N-Port Measurement and Analysis 

    N19307B PLTS N-Port Measurement and Analysis

    PLTS N19307B extends the N19301B base product to perform N-port (greater than 4 ports) measurements and analysis

  • N1930B Physical Layer Test System N19306B PAM-4 analysis 

    N19306B PAM-4 analysis

    • PLTS N19306B extends the N19301B base product to perform PAM4 eye diagram analysis beyond the default NRZ eye diagram analysis in the base N19301B.

  • N1930B Physical Layer Test System N19301B PLTS Base Analysis 

    N19301B PLTS Base Analysis

    • PAM-4 eye diagrams
    • Channel operating margin
    • MATLAB compatibility
    • Multi-channel advanced eye diagram
    • Hot TDR measurements

Discontinued Specialized RF Products - Antenna Test, Phase Noise, and Physical Layer Test Systems [已停產]
Product information and resources for discontinued specialized RF products.