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製造測試軟體解決方案

整合式、跨平台製造測試軟體解決方案,可加速組裝、測試及維修程序,使您在降低每次組裝成本的同時,也能達到品質的目標。

是德 Medalist 系統具有 MTSS 工具,可改善使用和共享所擷取資料的方式,包括 Medalist 維修工具、Medalist 品質工具和 CAMCAD 專業技術。Medalist 維修工具和 Medalist 品質工具,是由「是德智慧型測試架構」實現的整套解決方案之一部分,可允許與測試系統一起運作、自由通訊,以及分送整個企業的資訊。結合 CAMCAD 這些應用程式可重新定義測試的角色,並設置高度生產力跨領域整合的階段。最後結果::順暢的流程、更高的生產線良率,以及更低的營運成本。

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Procedure to backup ITF3.1.1 Database and DataStore and Restore Them in a New ITF Server with SQL200
This document is targeted at users who are archiving historical data or migrating to a more powerful server utilized to run Keysight’s ITF.

應用手冊 2008-07-28

PDF PDF 512 KB
Troubleshooting Medalist Intelligent Test Framework Port Problems
This document serves as a guide/reference to do preliminary analysis and troubleshooting when network/communication problems occur with the ITF server of the tester agent.

應用手冊 2008-05-22

PDF PDF 813 KB
CAD and Your Test System
Written by Stacy Kalisz Johnson. Published with permission from Circuits Assembly, November 2007.

專文 2007-08-11

PDF PDF 508 KB
Limited Access Testing
Written by Stacy Kalisz Johnson. Published with permission from Circuits Assembly, July 2007.

專文 2007-07-01

PDF PDF 137 KB
Pb-Free’s Impacts on Test and Inspection
Written by Stig Oresjo, Agilent Technologies. Article published in Circuits Assembly, January 2005.

專文 2005-12-05

PDF PDF 75 KB
ITF 3.1 File Directory Structure
This concise document provides information on the ITF3.1 File directory structure on the ITF server, Tester and Client applications (ART & AQT viewers).

使用手冊 2005-04-04

PDF PDF 146 KB
ITF 3.1 Server Setup Guide
This guide provides a step-by-step procedure on how to set up your own File Server, starting with installing the OS, MS SQL and finally MTSS ITF software using a Compaq ML370 Server as an example.

安裝手冊 2005-04-01

PDF PDF 884 KB
ITF 3.1 Setup Guide
Provides instructions on how to install and configure the Intelligent Test Framework Server and ART/AQT Viewer Client applications.

安裝手冊 2005-04-01

PDF PDF 2.83 MB
Selcom Testimonial
Customer testimonial which discusses the advantages gained from using the Keysight Medalist Family of test and inspection systems.

案例研究 2005-03-14

WMF WMF 19.21 MB
AQT 3.1 User Guide
This user guide offers simple tips on how to use AQT for different operating needs.

使用手冊 2005-02-01

PDF PDF 3.23 MB
ART 3.1 User Guide
This user guide offers simple tips on how to use ART for different operating needs.

使用手冊 2005-02-01

PDF PDF 3.77 MB
ITF 3.1 Reference Guide
Provides useful information to help user select and configure the file storage system, backup and restore data on the ITF server, how to configure the communication ports, troubleshooting network issues and more.

使用手冊 2005-01-10

PDF PDF 689 KB
ITF 3.1 Upgrade Guide
For those intending to upgrade to ITF 3.1 from the ITF 3.0 platform, this guide is a step-by-step platform migration procedure.

安裝手冊 2005-01-01

PDF PDF 1.23 MB
ITF 3.1 User Guide
Updated user guide for Intelligent Test Framework Software Solutions, Revision 3.1.

使用手冊 2005-01-01

PDF PDF 2.56 MB
Medalist Quality Tool (Formerly AQT) Optimization Guide
This guide offers simple tips on how to use AQT for different operating needs.

使用手冊 2004-10-22

PDF PDF 1.11 MB
The Importance of Test and Inspection When Implementing Lead-Free Manufacturing
Many papers, articles, and studies have been written about process issues, reliability issues, repair issues, and the merits of different alloys. This paper addresses the impacts on test and inspection when going lead-free.

應用手冊 2004-08-20

PDF PDF 260 KB
Medalist Quality Tool Datasheet
AQT provides statistical quality control and statistical process control analysis for Keysight test systems.

產品型錄 2003-11-01

PDF PDF 626 KB
Keysight Quality Tool Dashboards
Dashboards are preprogrammed targeted views that perform specific functions within the AQT software.

技術總覽 2003-09-30

Keysight Quality Tool Testimonials
Learn what users have to say about Keysight Quality Tool.

案例研究 2003-09-30

Intelligent Test Framework Software Solutions
Keysight's Intelligent Test Framework (ITF) and it's associated SQC / SPC and repair solutions, are optimized to work with Keysight testers enabling you to achieve your quality targets at a lower cost-per-assembly.

技術總覽 2003-07-25

PDF PDF 396 KB
AwareTest xi Case Study #3
This case study compares fault coverage of the current test strategy (automatic optical inspection/full in-circuit test) with a combined x-ray inspection/simplified in-circuit test strategy.

案例研究 2003-02-15

PDF PDF 164 KB
AwareTest xi Case Study #1
This case study compares a fully-probed in-circuit test on a conventional high node count test system with a combined x-ray/in-circuit test strategy, using the simplified in-circuit test.

案例研究 2003-02-15

PDF PDF 127 KB
AwareTest xi Case Study #2
This case study compares the current test strategy with a full combined test strategy and a simplified combined test strategy (x-ray inspection followed by simplified in-circuit test).

案例研究 2003-02-15

PDF PDF 763 KB
Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment
Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments.

應用手冊 2001-02-27

PDF PDF 575 KB
Tackling Advanced Technology Boards: Combining X-ray and ICT
Written by By Ed Crane, Ed Kinney and Bill Jeffrey. Printed with permission from Circuits Assembly, September 1999.

專文 1999-09-01

PDF PDF 890 KB