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Discontinued and Obsolete Parametric Test Equipment

  • 4140B pA Meter / DC Voltage Source [已停產] 4140B pA Meter / DC Voltage Source [已停產] 

    4140B pA Meter / DC Voltage Source [已停產]

    The 4140B was discontinued on November 1, 2000 and became obsolete on January 1, 2006.

  • 4142B Modular DC Source/Monitor [已停產] 4142B Modular DC Source/Monitor [已停產] 

    4142B Modular DC Source/Monitor [已停產]

    The 4142B was discontinued on July 1, 2003, and became obsolete on September 1, 2008.

  • 4145A/B Semiconductor Parameter Analyzers [已停產] 4145A/B Semiconductor Parameter Analyzers [已停產] 

    4145A/B Semiconductor Parameter Analyzers [已停產]

    The 4145A was discontinued on March 1, 1986 and became obsolete on November 1, 1993. The 4145B was discontinued in November 1, 1994 and became obsolete on November 1, 1999.

  • 4155A / 4156A / 41501A 半導體參數分析儀 [已停產] 4155A / 4156A / 41501A 半導體參數分析儀 [已停產] 

    4155A / 4156A / 41501A 半導體參數分析儀 [已停產]

    4155A、4156A 和 41501A 已經於 1998 年 1 月 1 日停產,並於 2003 年 1 月 31 日成為絕版品。

  • 4155B / 4156B 半導體參數分析儀 [已停產] 4155B / 4156B 半導體參數分析儀 [已停產] 

    4155B / 4156B 半導體參數分析儀 [已停產]

    4155B 和 4156B 已於 2000 年 12 月 1 日停產,並於 2006 年 2 月 1 日停止提供支援。

  • 4280A 1 MHz C Meter / C-V Plotter [已停產] 4280A 1 MHz C Meter / C-V Plotter [已停產] 

    4280A 1 MHz C Meter / C-V Plotter [已停產]

    The 4280A was discontinued on November 1, 2000 and became obsolete on January 1, 2006.

  • E5270A / E5272A / E5273A Parametric Measurement Solutions [已停產] E5270A / E5272A / E5273A Parametric Measurement Solutions [已停產] 

    E5270A / E5272A / E5273A Parametric Measurement Solutions [已停產]

    The E5270A, E5272A, and E5273A were discontinued on November 1, 2004, and are under support through December 31, 2012.

  • 4157B Modular Semiconductor Parameter Analyzer [已停產] 4157B Modular Semiconductor Parameter Analyzer [已停產] 

    4157B Modular Semiconductor Parameter Analyzer [已停產]

    The 4157B offers flexibility, expandability, and upgradeability in a PC-based measurement environment, providing a complete solution for parametric measurement and analysis.

  • Keysight VPA/PME 軟體 [已停產] Keysight VPA/PME 軟體 [已停產] 

    Keysight VPA/PME 軟體 [已停產]

    Keysight VPA/PME 能協助您以視覺分析、操作、管理及再利用大量的測試資料,在半導體製程、開發及整合中可縮短參數測試的時間

  • 4155C / 4156C Semiconductor Parameter Analyzers [已停產] 4155C / 4156C Semiconductor Parameter Analyzers [已停產] 

    4155C / 4156C Semiconductor Parameter Analyzers [已停產]

    A comprehensive set of instrument solutions for parametric test, usable standalone or through provided Windows-based software

  • B1507A Power Device Capacitance Analyzer [已停產] B1507A Power Device Capacitance Analyzer [已停產] 

    B1507A Power Device Capacitance Analyzer [已停產]

    • Measure all and CV parameters
    • Easy to use and fully automated measurement
    • Wide operation voltage up to 3 kV

  • Flat Panel Display Test Systems [已停產] Flat Panel Display Test Systems [已停產] 

    Flat Panel Display Test Systems [已停產]

    Product information for discontinued flat panel display test systems

  • Keysight 4070 系列進階參數測試系統 [已停產] Keysight 4070 系列進階參數測試系統 [已停產] 

    Keysight 4070 系列進階參數測試系統 [已停產]

    提供廣泛範圍的系統配置,以滿足您的生產參數測試需求。

  • Keysight 41000 系列整合參數分析與特性分析環境 (iPACE) [已停產] Keysight 41000 系列整合參數分析與特性分析環境 (iPACE) [已停產] 

    Keysight 41000 系列整合參數分析與特性分析環境 (iPACE) [已停產]

    Keysight 41000 系列是高度準確的 CV-IV 參數量測解決方案,可用於少量研發、實驗室和製程開發環境中的晶圓特性分析。

  • N9201A Array Structure Parametric Test System [已停產] N9201A Array Structure Parametric Test System [已停產] 

    N9201A Array Structure Parametric Test System [已停產]

    Supports up to 40 total SMUs for extremely fast characterization of in-line array test structures.

  • Obsolete product - I/CV 3.0 Lite Automation Software [已停產] Obsolete product - I/CV 3.0 Lite Automation Software [已停產] 

    Obsolete product - I/CV 3.0 Lite Automation Software [已停產]

    Provides interactive and automated control of parametric instruments in a PC-based environment.

  • Reliability Tests [已停產] Reliability Tests [已停產] 

    Reliability Tests [已停產]

    The ASUR (Advanced Scalable Unified Reliability) product family provides a range of semiconductor reliability test structures, measurement and analysis (C1280A, C1281A and C1282A).