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制造测试软件解决方案

是德正在退出自动光学检测和自动 x 射线检测业务。是德将会遵守现有的保修和支持合同,在支持期满前继续为客户提供备用部件、时间和材料服务和自我支持选件。产品的支持期限为停产后七年,从 2009 年 3 月 1日算起。

有关该退出声明的常见问题解答列表,请访问: www.keysight.com/find/inspection

不过,是德仍将全力以赴扩展其在印刷电路板组装测试市场中的在线测试(ICT)功能测试产品系列。

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Procedure to backup ITF3.1.1 Database and DataStore and Restore Them in a New ITF Server with SQL200
This document is targeted at users who are archiving historical data or migrating to a more powerful server utilized to run Keysight’s ITF.

应用说明 2008-07-28

PDF PDF 512 KB
Troubleshooting Medalist Intelligent Test Framework Port Problems
This document serves as a guide/reference to do preliminary analysis and troubleshooting when network/communication problems occur with the ITF server of the tester agent.

应用说明 2008-05-22

PDF PDF 813 KB
CAD and Your Test System
Written by Stacy Kalisz Johnson. Published with permission from Circuits Assembly, November 2007.

文章 2007-08-11

PDF PDF 508 KB
Limited Access Testing
Written by Stacy Kalisz Johnson. Published with permission from Circuits Assembly, July 2007.

文章 2007-07-01

PDF PDF 137 KB
Pb-Free’s Impacts on Test and Inspection
Written by Stig Oresjo, Agilent Technologies. Article published in Circuits Assembly, January 2005.

文章 2005-12-05

PDF PDF 75 KB
ITF 3.1 File Directory Structure
This concise document provides information on the ITF3.1 File directory structure on the ITF server, Tester and Client applications (ART & AQT viewers).

用户手册 2005-04-04

PDF PDF 146 KB
ITF 3.1 Setup Guide
Provides instructions on how to install and configure the Intelligent Test Framework Server and ART/AQT Viewer Client applications.

安装手册 2005-04-01

PDF PDF 2.83 MB
ITF 3.1 Server Setup Guide
This guide provides a step-by-step procedure on how to set up your own File Server, starting with installing the OS, MS SQL and finally MTSS ITF software using a Compaq ML370 Server as an example.

安装手册 2005-04-01

PDF PDF 884 KB
Selcom Testimonial
Customer testimonial which discusses the advantages gained from using the Keysight Medalist Family of test and inspection systems.

案例分析 2005-03-14

WMF WMF 19.21 MB
AQT 3.1 User Guide
This user guide offers simple tips on how to use AQT for different operating needs.

用户手册 2005-02-01

PDF PDF 3.23 MB
ART 3.1 User Guide
This user guide offers simple tips on how to use ART for different operating needs.

用户手册 2005-02-01

PDF PDF 3.77 MB
ITF 3.1 Reference Guide
Provides useful information to help user select and configure the file storage system, backup and restore data on the ITF server, how to configure the communication ports, troubleshooting network issues and more.

用户手册 2005-01-10

PDF PDF 689 KB
ITF 3.1 Upgrade Guide
For those intending to upgrade to ITF 3.1 from the ITF 3.0 platform, this guide is a step-by-step platform migration procedure.

安装手册 2005-01-01

PDF PDF 1.23 MB
ITF 3.1 User Guide
Updated user guide for Intelligent Test Framework Software Solutions, Revision 3.1.

用户手册 2005-01-01

PDF PDF 2.56 MB
Medalist Quality Tool (Formerly AQT) Optimization Guide
This guide offers simple tips on how to use AQT for different operating needs.

用户手册 2004-10-22

PDF PDF 1.11 MB
The Importance of Test and Inspection When Implementing Lead-Free Manufacturing
Many papers, articles, and studies have been written about process issues, reliability issues, repair issues, and the merits of different alloys. This paper addresses the impacts on test and inspection when going lead-free.

应用说明 2004-08-20

PDF PDF 260 KB
Medalist Quality Tool Datasheet
AQT provides statistical quality control and statistical process control analysis for Keysight test systems.

产品资料 2003-11-01

PDF PDF 626 KB
Keysight Quality Tool Dashboards
Dashboards are preprogrammed targeted views that perform specific functions within the AQT software.

技术总览 2003-09-30

Keysight Quality Tool Testimonials
Learn what users have to say about Keysight Quality Tool.

案例分析 2003-09-30

Intelligent Test Framework Software Solutions
Keysight's Intelligent Test Framework (ITF) and it's associated SQC / SPC and repair solutions, are optimized to work with Keysight testers enabling you to achieve your quality targets at a lower cost-per-assembly.

技术总览 2003-07-25

PDF PDF 396 KB
AwareTest xi Case Study #3
This case study compares fault coverage of the current test strategy (automatic optical inspection/full in-circuit test) with a combined x-ray inspection/simplified in-circuit test strategy.

案例分析 2003-02-15

PDF PDF 164 KB
AwareTest xi Case Study #1
This case study compares a fully-probed in-circuit test on a conventional high node count test system with a combined x-ray/in-circuit test strategy, using the simplified in-circuit test.

案例分析 2003-02-15

PDF PDF 127 KB
AwareTest xi Case Study #2
This case study compares the current test strategy with a full combined test strategy and a simplified combined test strategy (x-ray inspection followed by simplified in-circuit test).

案例分析 2003-02-15

PDF PDF 763 KB
Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment
Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments.

应用说明 2001-02-27

PDF PDF 575 KB
Tackling Advanced Technology Boards: Combining X-ray and ICT
Written by By Ed Crane, Ed Kinney and Bill Jeffrey. Printed with permission from Circuits Assembly, September 1999.

文章 1999-09-01

PDF PDF 890 KB