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已停产的参数测试系统[已停止生产]

The 4070 Series discontinued on November 30th, 2011.

The Keysight 4080 Series of parametric test systems is the replacement for the 4070 Series. The Keysight 4080 can perform all of the functions of the 4070 series, and it provides greater test efficiency and flexibility to solve various test challenges facing customers.
The 4070 Series provided the DC and RF measurement capabilities needed to test the 65 nm process technologies, as well as the sub-65 nm process technologies of future. The following list shows the 4070 Series key features.

  • Standards-based family with broad feature-set
  • Laboratory test capabilities now available for production test
  • Improved throughput and lowered cost of test
  • Thin gate oxide testing
  • Accurate testing for high-speed devices
  • Ultra short-pulsed measurement capability eliminates thermal effects
     
  • 4072A Advanced Parametric Tester [已停产] 4072A Advanced Parametric Tester [已停产] 

    4072A Advanced Parametric Tester [已停产]

    An all-in-one solution for advanced semiconductor process needs. The 4072A provides high throughput, production parametric test, ring oscillator measurement, Flash cell evaluation, advanced WLR tests.

  • 4072B Advanced Parametric Tester [已停产] 4072B Advanced Parametric Tester [已停产] 

    4072B Advanced Parametric Tester [已停产]

    The 4072B Advanced Parametric Tester enables semiconductor manufacturers to dramatically reduce test time for capacitance measurements.

  • 4073A Ultra Advanced Parametric Tester [已停产] 4073A Ultra Advanced Parametric Tester [已停产] 

    4073A Ultra Advanced Parametric Tester [已停产]

    The 4073A has all of the features of the 4072A. It also incorporates a high-resolution SMU (HRSMU) option and advanced relay design that enable current measurement resolution down to 1fA.

  • 4073B Ultra Advanced Parametric Tester [已停产] 4073B Ultra Advanced Parametric Tester [已停产] 

    4073B Ultra Advanced Parametric Tester [已停产]

    The 4073B Ultra Advanced Parametric Tester enables advanced semiconductor manufacturers to dramatically reduce test time and to execute ultra-low current measurements.

  • 4075 Advanced DC/RF/Pulse Parametric Tester [已停产] 4075 Advanced DC/RF/Pulse Parametric Tester [已停产] 

    4075 Advanced DC/RF/Pulse Parametric Tester [已停产]

    Meets the DC parametric, RF parametric, high frequency CV and pulsed IV measurement requirements necessitated by 65 nanometer (and below) technologies in a production test environment.

  • 4076 Ultra Advanced DC/RF/Pulse Parametric Tester [已停产] 4076 Ultra Advanced DC/RF/Pulse Parametric Tester [已停产] 

    4076 Ultra Advanced DC/RF/Pulse Parametric Tester [已停产]

    Meets the DC parametric, RF parametric, high frequency CV and pulsed IV measurement requirements necessitated by 65 nanometer (and below) technologies in a production test environment.