Column Control DTX

Accurate and Efficient Characterization of Power Devices at 3000 V/20 A

Application Notes

Driven by the twin requirements of improved energy efficiency and lower carbon emissions, the need for accurate power device characterization continues to take on increased importance. Device structures and fabrication processes are being improved, and new wide band gap (WBG) semiconductor materials, such as silicon carbide (SiC), gallium nitride (GaN), and gallium oxide (Ga2O3) are being studied to support higher voltages and provide a lower turn-on resistance. Meeting these needs requires a measurement instrument with the ability to handle both high voltage and high current.

×

Please have a salesperson contact me.

*Indicates required field

Preferred method of communication? *Required Field
Preferred method of communication? Change email?
Preferred method of communication?

By clicking the button, you are providing Keysight with your personal data. See the Keysight Privacy Statement for information on how we use this data.

Thank you.

A sales representative will contact you soon.

Column Control DTX