Microwave technology brings a new set of complex challenges. Keysight offers a wide range of high-frequency test equipment, solutions, and services to help you design, simulate, and test your latest innovations.
This year’s edition of EuMW will be held in Paris and is Keysight’s 16th consecutive year as Platinum Sponsor.
Access our EuMW Resource Library to discover how we can help you understand and master microwave complexities, so that your business can innovate quickly, transform and win.
Our EuMW Resource Library includes resources on the following topics:
- Aerospace and defense measurement solutions
- Wireless solutions focused on testing 5G technologies
- Millimeter-wave component testing
- RF and microwave circuit simulation software
DATES / TIME
Tuesday, October 1 – 09:30-18:00 CET
Wednesday, October 2 – 09:30-17:30 CET
Thursday, October 3 – 09:30-16:30 CET
Porte De Versailles Expo Centre, 1
Place de la Porte de Versailles, 75015
Stand Hall 7 – Stand E305
Keysight will showcase a range of revolutionary products and services which are helping innovators develop their new products.
Connect with the Solution Experts at Keysight Workshops
Ideas and research by engineers like you create the technology that enables innovations in 5G, aerospace and defense (A&D), and emerging markets. Let us help you design, simulate, and test your ideas to bring your dream to reality with the most accurate measurement solutions, software, and services. At European Microwave Week, attend our “Connect with the Experts” workshops. You will have the opportunity to meet Keysight’s industry experts to discuss four key topics:
- Component characterization
- 5G and wireless
- Aerospace and defense
- Design Software
Location: Rooms 731 + 732
1 OCTOBER - 09:30–13:15
09:30-10:15 - Verifying Multiple Sensors for Autonomous Cars
In conventional automotive applications, each sensor functions separately. The significant number of sensors for higher levels of Advanced Driver Assistance Systems (ADAS) is increasing and brings unexpected challenges to interference and interoperability. In this session, we will look at the pros and cons of sensors which are necessary for ADAS. You will learn about the challenges in sensor fusion and what to consider when verifying unexpected issues.
10:30-11:15 - Insights Into Automotive Radar Design And Lifecycle
From blind spot detection and parking assistance to adaptive cruise control and automatic emergency braking, radar applications have grown in vehicle utilization and increased in technological sophistication. The advanced technologies, such as 79 GHz frequency with 4 GHz modulation bandwidth and micro-Doppler to detect and protect pedestrians, has led to new design and test challenges. This session introduces solutions to solve difficult challenges across the automotive radar design and test lifecycle.
11:30-12:15 - Challenges And Solutions Of Advanced Automotive Radar Design
Advanced automotive radars with millimeter-wave frequencies and wide bandwidth are now an indispensable part of Advanced Driver Assistance Systems (ADAS) and autonomous driving vehicles. This workshop will review advanced automotive radar design challenges including verification of unique radar waveform designs, angle of arrival (AoA), micro-Doppler effect, transmit and receive antenna channel number, weather impacts, generation, and analysis of ultra-wideband millimeter-wave radar signals, ray tracing, and more. You will hear how Keysight automotive solutions can help you overcome these design challenges through simulation in research and development (R&D) before going to prototype.
12:30 - 13:15 - Estimation Method For The Coexistence Issue With Frequency Modulated Continuous Wave Radar
The evolution of new sensor technologies will have a significant impact on decision-making in autonomous driving technology. The requirements for automotive radar are gradually changing from the basic ability of conventional radar to detect objects, to the advanced capability of imaging radar with the ultra-high-resolution performance for object recognition. In this session, we will look at the pros and cons of an advanced radar system in comparison to conventional frequency modulated continuous wave (FMCW) radar. Join us to hear about the latest enabling technologies.
1 OCTOBER - 14:00 – 17:30
14:00-14:45 - Using Active Hot Parameters And X-Parameters To Improve Active Device Measurement Accuracy
Active (Hot) parameters using X-parameter technology with a high-performance Vector Network Analyzer (PNA-X) provide a more accurate method to test hot S-parameters, gain and output power than traditional methods. In this session, you will learn how this technique removes the active device and system mismatch interaction to precisely calculate the active parameters and output power into a nominal 50-ohm environment. You will also learn how the X-parameter technology provides coefficients of the equation to calculate linear and non-linear device performance of gamma-opt (optimum), optimal load match, and maximum delivered power to an optimum load.
15:00-15:45 - Understanding Power Measurement Of Modulated Signals
The ability to make consistent measurements of RF or microwave power levels is important in the development of radio systems. Making measurements requires an informed choice of equipment and approach, to ensure that the limitations of each does not undermine the validity of the measurements. Measure accurately the power of a modulated signal requires care and attention to avoid incorrect results. This paper will look at the best techniques that can be used to measure those challenging signals with confidence.
16:00-16:45 - New Methodology For Wideband Millimeter-Wave 5G EVM Measurement
Design verification and production test engineers traditionally face the challenges of modeling, designing, and measuring RF/mmW amplifiers under wideband modulated conditions using a signal generator and signal analyzer. This session discusses a new technique that overcomes these challenges with improved accuracy, ease of test, and faster throughput. We will present a new workflow able to measure non-linear error vector magnitude (EVM) on Power Amplifiers providing identical results as the traditional method under modulated stimulus.
17:00 -17:30 - Perfecting Your Wideband Modulated Source: Distortion and Correction
In modern 5G and SatCom communications signaling, signal power and fidelity are critical to evaluating high-performance components. Current technology limits the quality of signals, including flatness and distortion. New methods recently introduced allow full frequency response equalization and distortion correction to create high-performance signals which significantly exceed the native capability of the existing hardware. In this session, you will learn how to correct adjacent channel power ratio (ACPR) distortion as well as high-performance noise power ratio (NPR) correction. These corrections coupled with new distortion measurements provide state-of-the-art performance for component analysis using wideband modulated signals.
2 OCTOBER - 09:30 – 12:15
09:30-10:15 - Generating And Analyzing 5G New Radio Signals
The 3GPP 5G New Radio (NR) standard brings several new features to the physical layer necessary to achieve new use cases like enhanced mobile broadband and ultra-reliable low-latency communications. The first part of this presentation will examine some of these new features and provide a brief introduction to the 5G NR physical layer with a focus on generating and analyzing these signals. The second part of the presentation applies these concepts toward performing the 3GPP 5G gNB conformance tests as outlined in TS38.141; including the new over-the-air (OTA) requirements.
10:30-11:15 - Tackling Emerging Millimeter-Wave Applications Beyond 50 GHz (802.11ay, 5G NR)
Large swaths of contiguous millimeter-wave spectrum offer the allure of using these bands for new and relevant high-data throughput applications. Emerging applications such as 802.11ay require bandwidths of approximately 4 GHz, with the potential of up to 8 GHz of bandwidth moving forward. However, this requires careful consideration in designing and testing systems to support these wider modulation bandwidths and higher-order modulation types. This presentation will discuss some of the challenges that these very wide signal bandwidths introduce, and present considerations for optimizing system performance. A simulation case study will be used to illustrate the impact of design impairments on system EVM performance.
11:30-12:15 - Simulate 5G NR RF Front-End And Phased Array Beamforming
Designers need to investigate, implement, and verify their communications PHY signal processing designs with dynamic link-level scenarios to include both classical and phased-array antennas. Keysight’s standard-compliant 5G library supports several multi-antenna system architectures. These system architectures include digital, RF, and hybrid beamforming, as well as advanced high-order MIMO signal processing. The library consists of signal processing building blocks, subsystems, reference multi-antenna system modeling examples, and infrastructure components. System architects can execute realistic technical research to easily migrate from one 5G communication system design concept to another. This presentation covers a new system/circuit co-design flow as well as design support for phased array subsystems to enable beamforming techniques.
2 OCTOBER - 13:45 – 17:00
13:45-15:15 - Electronic Warfare Test And Evaluation
Military conflicts involving electronic warfare (EW) require fast decision-making in a rapidly changing threat environment consisting of many RF and microwave emitters. Ensuring device performance under such conditions is critical to speed deployment of EW systems and for superiority in battle. This workshop will cover the theory and definitions of radar and electronic warfare. Join us to learn how an EW threat emitter environment is used during the evaluation of an EW system’s angle-of-arrival and the time difference of arrival performance. We will also cover the generation of RF wavefronts from environment scenarios using pulse descriptor words and the measurement concepts for configuring a test threat environment.
15:30-17:00 - Phase Noise Theory and Measurement Workshop
In radar and communication systems, phase noise can limit performance. Sensitivity in processing Doppler-shifted targets, as well as EVM in complex digitally modulated communications, can be adversely affected. This workshop explains phase noise fundamentals, and measurement and its impact on the performance of RF/microwave systems. We will compare different measurement instruments and techniques. You will learn the role of the phase detector and the use of cross-correlation in optimizing sensitivity and the impact of reference sources on phase noise measurements. The workshop includes a demonstration of residual and absolute phase noise examples and practical device under test (DUT) measurements. Attend this session to hear about the latest AM Noise measurement techniques.
3 OCTOBER - 11.00 – 14.00 (Lunch will be provided)
Chip-package co-design flow for mm-Wave application like 5G and Automotive Radar
The number of mm-Wave applications, in particular within 5G and Automotive Radar, is growing rapidly. While this brings various benefits like extremely low latency and very high bandwidth, it also brings big challenges for the semiconductor industry in designing the RF chips. The level of integration of RF and mm-wave systems is increasing and this has an impact on the electrical properties and system parameters. It is insufficient to model chip, package and PCB separately, as some high-frequency effects may not be captured, as electromagnetic coupling between integrated coils on chip and routing traces in the package. Electromagnetic simulation is used for signal integrity, parasitic extraction and antenna radiation performance. At frequencies around 24, 60 or 77 GHz, EM simulation is a must have and schematic-only simulations becoming meaningless.
The seminar will cover technology trends and applications for mm-Wave applications. You will learn why co-design of Chip-Package-Board interfaces is mandatory at mm-Wave frequencies. We will show the results of the collaboration between GlobalFoundries, Fraunhofer and Keysight to provide a qualified reference flow for advanced system integration. It is crucial to go beyond the IC for mm-Wave applications and this requires a complete Assembly Design Kit (ADK) beyond the typical Process Design Kit (PDK). Fraunhofer focuses on the APIs to EDA platforms, reference designs & measurements to qualify the flow. Finally we present and demonstrate a complete chip-package co-design flow, which allows improvement of RF performance and power efficiency. By designing concurrently, silicon, package and system can be optimized and validated with fewer iterations before tape-out. The flow has been validated on GlobalFoundries’ 22FDX process which targets mm-Wave designs.
- Silicon Technologies for mm-Wave applications, Kenneth Barnett, GlobalFoundries
- Design Challenges for mm-Wave applications and why EM and going beyond IC is a must, Vadim Issakov, Infineon Technologies
- Application Design Kit (ADK) – why it’s crucial to go beyond the IC for mm-Wave applications, Saquib Bin Halim, GlobalFoundries
- mm-Wave reference designs and EDA flow enablement for Advanced System Integration, Andy Heinig, Fraunhofer IIS-EAS
- EDA solutions for analyzing on-chip and off-chip RF impairments, Cedric Pujol, Keysight Technologies
- Wafer-level Package reference flow and correlation with measurements, Vincent Poisson, Keysight Technologies
Keysight’s Involvement in EuMW Conference
Keysight Technologies will present a series of papers during the conferences at this year's EuMW 2019, to see what will be presented and where, please see the below information.
SUNDAY, SEPTEMBER 29
EuMC: 'SS-02 (EuMC/EuMIC) Silicon-Based Integrated Technology Platform for Millimeter Wave (mmW) and Terahertz (THz) Applications'
Keysight Speaker: Aidin Taeb
Time: 08:30 – 12:30 CET
EuMC: 'Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity'
Keysight Speaker: Georg Gramse, Ferry Kienberger
Time: 17:10 – 17:30 CET
MONDAY, SEPTEMBER 30
EuMC: 'Stimulus-response characterization of radio transmitter components under wideband repetitive test signals'
Keysight Speaker: Jean-Pierre Teyssier
Time: 08:30 – 12:30 CET
EuMC: 'Predicting Electro-Thermal Effects in Active Circuits for 5G'
Keysight Speaker: Vincent Poisson
Time: 08:30 – 17:50 CET
Automotive Forum: 'The Coded MIMO Radar System Design and the Consideration of the New Technologies' Verification and the Estimation Method for the Coexisting Issue with FMCW Radar.
Keysight Speaker: Seung Chul Shin
Time: 17:10 – 17:30 CET
TUESDAY, OCTOBER 1
Women in Microwave Engineering Event: 'See the World Outside of the Design Lab'
Keysight Speaker: Amele Salah
Time: 13:00 – 17:50 CET
Room: WiM Stand, E07
MicroApps: '3GPP 5G NR gNB Multi-Channel Test Techniques'
Keysight Speaker: Randall Becker
Time: 13:00 CET
‘EuMC/EuMIC05-5: A Novel Wide-Band Finger-Shaped Phase Shifter on Silicon-OnGlass (SOG) Technology for Sub-Millimeter Wave and Terahertz Applications'
Keysight Speaker: Aidin Taeb
Time: 15:10 – 15-30 CET
WEDNESDAY, OCTOBER 2
EuMC: 'Measurement and Modeling Techniques'
Keysight Speaker: David E. Root
Time: 16:10 – 16:30 CET
MicroApps: 'Tackling Emerging Millimeter-Wave Applications Beyond 50 GHz (802.11ay, 5G NR)'
Keysight Speaker: Greg Jue
Time: 13:20 CET
THURSDAY, OCTOBER 3
EuMC/EuRAD: 'mm-Wave Beamformer Chips with Smart-Antennas for 5G: Toward Holistic RFSOI Technology Solutions including RF-ADCs'
Keysight Speaker: Riccardo Giacometti
Time: 10:50 – 12:30 CET
Room: Exhibition Hall
Keysight presents a selection of literature specifically created for EuMW. Learn more about Keysight’s latest design and measurement solutions to help you overcome your challenges with the ever-evolving world of microwave technology.