Data center operators can ensure seamless transition from 100GE to 400GE by introducing next generation transceivers that increase channel capacity, guarantee quality and interoperability, and reduce test time and cost. Advanced modulation and coding, characterization and compliance test, and test efficiency can solve these test challenges.

400GE in the data center is on the horizon. Keysight can help you overcome any implementation challenges and get you there faster.

Challenge 1: Increase channel capacity

The move from 100GE to 400GE in the data center is revolutionary, not evolutionary. Optical transceivers will use advanced signal modulation and coding to reach 400GE speeds. These techniques create new test challenges for transceiver manufacturers. We can help you address your 400GE data center implementation challenges using advanced modulation and coding techniques.

Challenge 2: guarantee quality and Interoperability

Data center operators need to support both 100GE and 400GE in their data center networks. Network downtime due to faulty transceivers is not an option. New transceiver technology must be thoroughly tested to comply with industry specifications to ensure seamless compatibility before it is inserted into the network.

The faster and more complex the network, the more difficult and time-consuming characterization and compliance test become. We work with optical component and transceiver manufacturers to ensure their designs have strict compliance with the latest industry specifications. Support for 100GE and 400GE will coexist in the data center, and interoperability of transceivers from different vendors as well as with other network components is critical.

Challenge 3: Reduce test time, reduce cost

The cost of optical transceivers is the major contributor to the cost of data centers transitioning from 100GE to 400GE. Testing the broad range of data rates in these transceivers more efficiently accelerates design innovation and lowers cost. The cost of transceivers is directly proportional to the complexity of the design and the number of optical components. Test time is also significant and contributes to the overall cost of the transceiver.

Test efficiency of next-generation transceivers will lower the cost per port, resulting in less power and smaller footprint. The process begins in the research and development phase with the design of transceiver components and continues to the design and validation of the transceivers through to manufacturing test. Let us help you improve your transceiver test efficiency.

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