Here's the page we think you wanted.
See search results instead:
Choose a country or area to see content specific to your location
Enable browser cookies for improved site capabilities and performance.
Toggle Menu
-
PRODUCTS AND SERVICES
- Oscilloscopes
-
Analyzers
- Spectrum Analyzers (Signal Analyzers)
- Network Analyzers
- Logic Analyzers
- Protocol Analyzers and Exercisers
- Bit Error Ratio Testers
- Noise Figure Analyzers and Noise Sources
- High-Speed Digitizers and Multichannel DAQ Solutions
- AC Power Analyzers
- DC Power Analyzers
- Materials Test Equipment
- Device Current Waveform Analyzers
- Parameter / Device Analyzers and Curve Tracers
- Meters
- Generators, Sources, and Power Supplies
- Software
- Wireless
- Modular Instruments
- Network Test and Security
- Network Visibility
- Services
- Additional Products
- All Products, Software, Services
- Learn
- Buy
- Support
What are you looking for?
Suggested searches
No product matches found - System Exception
Matched content
- Home
- Products and Services
- ...
- Instrument Workflow Software
- PathWave X-Series Measurement Applications
- N9080EM4E LTE V2X Measurement Application, Multi-Touch UI
N9080EM4E LTE V2X Measurement Application, Multi-Touch UI
Perform LTE-V2X transmitter measurements
This product is not purchasable.
Please exit this procurement session to buy.
Please exit this procurement session to buy.
This product is over the price threshold for your account.
To buy, contact your procurement team.
To buy, contact your procurement team.
Sold by: Keysight Online Sales
Starting from
Perform LTE-V2X one-button measurements for Sidelink using PC5 interface defined by 3GPP standards.
Highlights
- Perform C-V2X transmitter one-button measurements per 3GPP Rel.14 standard
- Support demodulation analysis for PSSS, SSSS, PSBCH (with DMRS), PSCCH (with DMRS), and PSSCH (with DMRS)
- Support decoding for PSCCH and PSSCH
- Spectrum and power measurements: channel power, SEM, ACP, OBW, and CCDF
- Modulation analysis measurements: I/Q measured constellation, EVM (rms, peak), frequency error, symbol clock error, I/Q offset, Error vector time, Error vector spectrum, In-band emission, and frame summary etc.
- Support multi-touch user interface and SCPI remote interface programming
- Keysight supports tiered application models with N-models for UXA/PXA/PXE, E-models for MXA/EXA/MXE/VXT, and W-models for CXA. The higher tiered application models can run at the lower platforms, which means N-models can run on all platforms, E-models can run on MXA/EXA/MXE/VXT and CXA, and W-models can only run on CXA
Extend the Capabilities of Your Product
Want help or have questions?
- © Keysight Technologies 2000–2024
- Privacy
- Sitemap
- Terms
- Trademark Acknowledgements
- Feedback
- Accessibility