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4080 Series Parametric Test Systems
A high-throughput parametric test system with advanced parallel testing capabilities, a high-speed capacitance measurement option, and SEMI standards.
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Highlights
4080 Series: Parametric Test System Total Solution
Keysight 4080 Series offers a wide range of measurement capabilities required for the fundamental parametric tests. You can easily perform DC and capacitance measurements such as Vth, Ids, Idoff, and Cox, to name just a few. 4080 Series supports three types of SMU (Source Monitor Unit) for DC measurement. Several other instrument options, such as a digital voltmeter(DVM), a spectrum analyzer, and an LCD meter, provide enhanced measurement capabilities.
- Industry-standard Parametric Test System with SPECS and 4070 Series compatibility
- Increase throughput up to 50% with asynchronous and synchronous parallel test capability
- More flexible configurations: standard low-current and ultra low-current (12 to 48 pins)
- Facilitate test automation with SEMI standards
- Lower cost with Linux OS
- Totally integrated parametric test solution with service and support
Designed to Meet Measurement Challenges of Mainstream Semiconductor Technologies
4080 Series offers two models as configurable for your test requirements. 4082A Parametric Test System covers the essential parametric tests for mature and advanced semiconductor devices and has synchronous and asynchronous parallel test capabilities. 4082F Flash Memory Cell Parametric Test System supports the high-voltage semiconductor pulse generator (HV-SPGU) modules and 81150A pulse generator to characterize flash memory cell technologies.
Key Specifications
4082A — Industry-standard Parametric test system
If you use 4070 Series tester without any service and support agreements, you have a chance to get back to professional service and support by upgrading to 4080 Series.
Simplest and an easiest migration path from 4070 Series testers with guaranteed 4070/SPECS program compatibility and data correlations.
- Source Monitor Unit selectable form medium power (MPSMU), high power (HPSMU) and high resolution (HRSMU)
- Synchronous and asynchronous parallel test can improve the throughput with VMT (Virtual Multiple Testhead ) software
- 1 fA and 0.1 uV measurement resolution
- Optional HS-CMU (High-Speed Capacitance Measurement Unit)
- Optional ring oscillator measurement
4082F - Flash memory cell parametric test system
Full parametric test capabilities plus SPGU (Semiconductor Pulse Geneation Unit) mainfame and high-voltage SPGU modules for evaluating write/erase characteristis of NAND flash memory cells.
- Fast and precise measuremenrts with built-in pulse SPGU up to 10 channels
- Can select lower cost pulse generator with Keysight 81150A up to 2 channels
Extend the Capabilities of Your 4080 Series Parametric Test system
Featured Parametric Test System Resources
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