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White Papers
Large swaths of contiguous millimeter-wave spectrum have opened in the U.S, offering opportunities for using these bands for very high-data throughput applications. This requires careful consideration in testing millimeter-wave systems to gain insight into the actual performance.
Increasing data throughput is possible using several different methods. One method is to use higher symbol rates and more channel bandwidth. Higher-order modulation, such as 64 QAM, is possible if the radio’s performance is sufficient. To measure the radio performance under these conditions, however, the millimeter-wave test bed system’s residual EVM noise floor must be low enough so that the radio’s true performance is measured. The millimeter-wave test bed’s residual EVM performance should not be the dominant source of error; otherwise, it masks the radio’s true performance.
This whitepaper will show a new R&D test bed which uses the latest developments in ultra-high-performance digital oscilloscope technology. This innovative technology will be applied to very-wide bandwidth emerging millimeter-wave applications.
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