N9418S 9500 Atomic Force Microscope (AFM)
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| AFM-Based Characterization of Electric Properties of Soft Materials - Application Note
Local electric and dielectric properties of materials in a broad frequency range (up to several GHz) and effects of vapor condensation have been studied with environmental AFM in this note.
Руководство по применению 2018-03-09 |
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3.12 MB
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| Studying Thermal Transitions of Materials Using Quick Scan Technology in Atomic Force Microscopy
Руководство по применению 2017-12-22 |
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5.03 MB
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| Using AFM and Nanoindentation Techniques for Comprehensive Nanomechanical Analysis of Materials
Comprehensive nanomechanical property studies of several polymer samples and metallic alloy of Bi/Sn are performed on both Keysight 9500 AFM and G200 Nanoindenter with good consistency in results.
Руководство по применению 2017-11-21 |
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2.10 MB
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| Atomic Force Microscopy Studies of Materials in Different Vapor Environments - Application Note
Visualization of surface structures and examination of properties of polymers by Keysight 9500 AFM in various humidity and in vapors of different organic solvents.
Руководство по применению 2017-11-08 |
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8.01 MB
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| 9500 AFM - Data Sheet
Data sheet for the 9500AFM with quick Scan, New Nano Navigator software and New Auto Drive for quick automatic setting off parameters
Техническая информация 2017-10-26 |
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2.69 MB
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| Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity -App Note
Wideband electrostatic force microscopy that extends the available EFM frequency range from the kHz to the GHz range as well as the measuring capabilities, which works in tapping or lift mode therefore reduces the tip wear and sample modifications.
Руководство по применению 2017-08-21 |
PDF
598 KB
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| Adopting Fast Imaging in Atomic Force Microscopy - Application Note
Fast imaging with Keysight 9500 AFM Quick Scan on multiple samples to demonstrate its capabilities for routine sample measurements with extremely improved productivity, as well as to provide the examples of visualization of several dynamic processes in different vapor environments.
Руководство по применению 2017-08-18 |
PDF
4.22 MB
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| AFM study of Structural Organization of Liquid Crystalline Oligomer - Application Note
Studies of liquid crystalline oligomer at different temperatures and in vapors of organic solvents using Keysight 9500 AFM.
Руководство по применению 2017-06-15 |
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3.96 MB
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| Piezoresponse Force Microscopy using Keysight 9500 AFM - Application Note
PFM has become recognized as a key tool in advancing the research and development of applications based on piezoelectric materials in general. This note shows the capabilities of the 9500 AFM
Руководство по применению 2017-04-18 |
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1.80 MB
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| Comprehensive Atomic Force Microscopy with Keysight 9500 Scanning Probe Microscope - App Note
An AFM study of polymers under various environments using AM & Quick Sense Modes. Optimizing the tip torce for characterization of top layer and sub-surface layers.
Руководство по применению 2017-03-09 |
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6.24 MB
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| Atomic Force Microscopy of Heterogeneous Materials in Different Environments - Application Note
A study of polymers under different environments using the 9500
Руководство по применению 2017-03-09 |
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5.29 MB
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| Nanomechanical Studies in Atomic Force Microscopy - Application Note
Study of the 9500 AFM using Quick Sense to achieve nanomechanical properties of various materials
Руководство по применению 2017-03-09 |
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4.15 MB
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| High Resolution Imaging with Keysight 9500 AFM - Application Note
This application note demonstrates that the Keysight 9500 AFM is capable of very high-resolution imaging.
Руководство по применению 2016-12-08 |
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1.87 MB
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| QuickScan Imaging of in situ Dynamical Processes Using Keysight 9500 AFM - Application Note
This application describes Quick Scan on the 9500 AFM and includes examples showing the application of the technology for capturing in situ dynamical processes.
Руководство по применению 2016-11-09 |
PDF
989 KB
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| In situ Electrochemical Measurement Using 9500 AFM - Application Note
Electrochemical SPM has been applied to study a wide range of systems ranging from surface adsorption, film growth & dissolution, membrane transport, battery, fuel cell & photovoltaic using the 9500
Руководство по применению 2016-10-11 |
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1.13 MB
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| Post Processing Pico Image Software for Keysight AFM Systems - Data Sheet
Pico Image surface imaging and analysis software is dedicated to Keysight AFMs and SPMs. It contains three levels for basic, advanced, and expert users. Standalone and network licenses are available.
Техническая информация 2016-07-02 |
PDF
2.89 MB
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| Kelvin Force Microscopy Using the 9500 AFM - Application Brief
Discussion on KFM mode using the 9500AFM and QuickScan
Руководство по применению 2016-06-07 |
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1.75 MB
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| 9500 AFM Applications in Polymer Materials - Application Note
Application note describing the use of the 9500 AFM in Polymer research
Руководство по применению 2016-05-23 |
PDF
2.16 MB
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| Advanced Nanomeasurement Solutions - Brochure
High level nanotechnology brochure discussing AFM, FE-SEM and Nanomechanical Testing Systems capabilities across industries and research areas.
Брошюра 2016-05-06 |
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7.07 MB
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| Magnetic Force Microscopy Using the 9500 AFM - Application Note
Magnetic Force Microscopy (MFM) is an Atomic Force Microscopy mode that enables researchers to probe the magnetic properties of a material. This note explores the characterization of magnetic samples.
Руководство по применению 2016-04-25 |
PDF
2.08 MB
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| Keysight AFM 9500 Demo Video
Keysight AFM 9500 Demo Video
Демонстрация 2015-07-23 |
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| Scanning Microwave Microscopy (SMM) Mode - Data Sheet
Техническая информация 2008-08-26 |
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368 KB
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