Типовые решения на базе модульных приборов
Сконфигурируйте систему в соответствии со своими потребностями
Если вам требуется система для решения сложных задач тестирования, компания Keysight готова поделиться своим богатым опытом в области измерений, создания модульных приборов в формате PXI и автоматизации испытаний.
При решении специализированных задач компания Keysight и ее партнеры помогут вам подобрать компоненты и выполнить интеграцию испытательной системы в формате PXI.
Приведенные ниже примеры решений в формате PXI разработаны для использования в конкретных приложениях и оптимально используют масштабируемость PXI системы, ее габаритные размеры и производительность. Каждое решение может быть легко адаптировано для ваших требований к проведению испытаний. Ознакомьтесь с модульными системами компании Keysight и посмотрите, как они помогают расширить границы тестирования.
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5G Channel Sounding, Reference Solution
5G Channel Sounding, Reference Solution
- Signal generation up to 44 GHz w/ 2 GHz modulation BW
- Signal analysis up to 50 GHz w/ 1 GHz analysis BW
- Chan-to-Chan phase coherence < 1 deg, nominal
- On-board FPGAs, real-time data processing, up to 250 MB/s per-chan streaming to RAID
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5G R&D Test Bed
5G R&D Test Bed
- Generate and analyze candidate 5G waveforms: custom IQ, OFDM, FBMC
- Scalable modulation bandwidths and frequency bands
- Supports many topologies for transmitter/receiver testing (IQ, IF, RF, microwave, millimeter-wave)
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6G Sub-Terahertz R&D Testbed
6G Sub-Terahertz R&D Testbed
- Up to 10 GHz of bandwidth at D-band (110-170 GHz) and G-band (140-220 GHz)
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Offers flexibility and scalability in prototyping various types of waveforms and operating in different frequency bands.
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802.11ad Testbed, Reference Solution
802.11ad Testbed, Reference Solution
- Generate/analyze coded 802.11ad waveforms w/ flexible parameters
- Precorrect waveforms, I/Q imbalances & channel response
- Supports topologies, Tx/Rx testing (IQ, IF, RF, microwave, mm-wave)
- Independent reference, debug & validate hardware
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Beamformer IC Test Solution
Beamformer IC Test Solution
Keysight’s beamformer IC test solution comprehensively supports test requirements in the development to production workflow for 5G beamformer ICs.
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DDR4 Functional/Protocol Debug and Analysis Reference Solution
DDR4 Functional/Protocol Debug and Analysis Reference Solution
- Confidently follow signal flow in your system to resolve issues
- Validate protocol compliance and accurately identify failures
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Anticipate signal integrity issues with bus level signal integrity insight
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DDR4 Parametric Test Reference Solution
DDR4 Parametric Test Reference Solution
- Complete DDR4 debug, analysis and compliance testing
- 100% parametric test coverage in accordance to JEDEC specifications
- Fast DDR4 protocol decode capability
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Superior signal integrity BGA probing
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Digital Interconnect Test System, Reference Solution
Digital Interconnect Test System, Reference Solution
- Provides full signal integrity analysis of high-speed digital interconnects up to 32-ports
- Performs multi-domain analysis including time, frequency, eye diagrams, crosstalk, skew and much more
- PLTS with API provides fast and easy measurements
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Digital Interconnect Test System, Reference Solution
Digital Interconnect Test System, Reference Solution
- Provides full signal integrity analysis of high-speed digital interconnects up to 32-ports
- Performs multi-domain analysis including time, frequency, eye diagrams, crosstalk, skew and much more
- PLTS with API provides fast and easy measurements
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E-Band Signal Analysis Reference Solution
E-Band Signal Analysis Reference Solution
- mmW modulation bandwidth up to 2.5 GHz
- 55/60 GHz to 90 GHz E-band frequency range coverage
- Baseband / IF analysis frequency range coverage up to 33 GHz
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Lower-cost E-band analysis capability
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LTE/LTE-Advanced Multi-Channel, Reference Solution
LTE/LTE-Advanced Multi-Channel, Reference Solution
- Up to 4x4 time synchronized MIMO
- 1 MHz to 3 GHz or 6 GHz
- Up to 160 MHz
- < 20 ns channel-to-channel synchronization
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Power Integrity Analyzer Reference Solution
Power Integrity Analyzer Reference Solution
- Solutions optimized to measure power rail noise
- Easy and efficient debugging solutions for power quality analysis
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Supports up to ± 24 V offset
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Remote Radio Head Test, Reference Solution
Remote Radio Head Test, Reference Solution
- Increase test throughput
- Reduce overall cost and resources
- Gain confidence using CPRI with a comprehensive solution
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Satellite Signal Monitoring, Reference Solution
Satellite Signal Monitoring, Reference Solution
- Shared 27 GHz VSA, multi-band, power spectrum scanning & digital demodulation
- Low power and weight
- Cost efficient
- Easy to scale # of scanned bands
- Also available w/ 27 GHz VSA each band, parallel acquisitions all bands
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VoLTE Battery Test, Reference Solution
VoLTE Battery Test, Reference Solution
- Simplified product structure
- Fully compliant w/ VoLTE battery test plans
- Automation test scripts: multiple radio access technologies, protocol logging tool, IMS/SIP environment, battery drain test w/ DC power source, modules & analysis software
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Wideband Signal Analysis for Satellite Test, Reference Solution
Wideband Signal Analysis for Satellite Test, Reference Solution
- Up to 50 GHz
- > 1 GHz analysis bandwidth
- Analyze & demodulate both commercial or custom formats
- Integrated record & playback of IQ data
- High performance: aerospace, defense, commercial communications & more
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5G NR Base Station Test
5G NR Base Station Test
5G Base Station Manufacturing & Design Verification Test Solutions that offer the lowest nnWave Cost-of-test and smallest industry footprint
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S5060A Quantum Engineering Toolkit (QET), Reference Solution
S5060A Quantum Engineering Toolkit (QET), Reference Solution
Keysight’s Quantum Engineering Toolkit (QET) provides:
- use in single and multi-qubit research lab experiments
- control sequence development
- Hard Virtual Instrumentation (HVI) controls
- user friendly FPGA program interface
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S8890A Wireless Device Functional Test Reference Solution
S8890A Wireless Device Functional Test Reference Solution
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LTE TDD, LTE FDD, LTE NB-IoT, W-CDMA, GSM signaling
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Data Performance/Throughput
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VoLTE IMS/SIP
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Battery Drain
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TS-8989 Automotive Body and Safety Test Reference Solution
TS-8989 Automotive Body and Safety Test Reference Solution
- Automotive electronics Body and Electronics reference solution
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Y1299A Стартовый комплект для модульных решений в формате PXI
Y1299A Стартовый комплект для модульных решений в формате PXI
Специализированный стартовый комплект для модульных решений в формате PXI, включающий инструкции по работе с конкретным приложением и примеры программ.