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Analog Test

The big test challenges may be digital but there are still a lot of analog devices used in printed circuit boards today. Hence there is a need for high-accuracy testing to ensure the quality of these analog devices.

Analog devices range from the simplest of passive components to the very complex active integrated circuits. The Keysight Medalist in-circuit test (ICT) systems can test these analog devices.

The heart of the ICT system is the Analog Stimulus and Response Unit (ASRU) that allows the ICT system to make analog measurements in situations where other systems cannot. To provide the greatest analog accuracy, the analog sub-system automatically recalibrates itself to compensate for time and temperature changes.

The following table lists some of the Analog ICT measurement specifications guaranteed over the operational temperature range of the ICT system (5 to 40 degrees C):

Resistance0.1 to 1 Mohm
1M to 10 Mohm
±0.25% typical
±5.0% worst case
Unguarded accuracy
Worst case guarding
Capacitance10pF to 0.01F±2% 
Inductance5uH to 100H±3% worst case 
Transistor Beta10 - 1000±15%100uA to 100mA bias
Zener Diode 0-18V±1%10uA to 100mA bias

The ICT system also incorporates an adaptive analog measurement technique to maximize test throughput for resistance and capacitors.

In addition, the ICT system offers an array of built-in instrumentation to allow users to perform analog and mixed signal functional testing of the unit under test. This built-in instrumentation includes:

  • AC Voltage Detector
  • DC Voltage Detector
  • Dual Voltage Source
  • Sine, Square and Triangle Function Generator
  • Arbitrary Waveform Generator
  • Waveform Digitizer
  • Frequency Detector
  • Pulse Width and Time Interval Detector

External instrumentation can be controlled by the built-in IEEE-488, RS-232, or USB interfaces.

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