Highlights

E4991B Impedance Analyzer 1 MHz - 3 GHz

The Keysight E4991B Impedance Analyzer is the perfect solution for characterizing and evaluating electronic components, semiconductor devices, and materials. 

  • Three upgradable frequency options: 1 MHz to 500 MHz/1 GHz/3 GHz
  • Basic accuracy ±0.65% and 120 mΩ to 52 kΩ impedance range (10% measurement accuracy range)
  • Measurement parameters: |Z|, |Y|, θ, R, X, G, B, L, C, D, Q, |Γ|, Γx, Γy, θΓ, Vac, Iac, Vdc1, Idc1 (1. Option 001 is required)
  • Built-in DC bias (Option 001): 0 V to ±40 V, 0 A to ±100 mA
  • 4-channel & 4-trace on 10.4-inch color LCD with touch screen
  • Data analysis function: Equivalent circuit analysis, limit line test
  • Dielectric/magnetic material measurement (Option 002): |εr|, εr', εr'', tanδ(ε), |μr|, μr', μr'', tanδ(μ)
  • Temperature characteristics measurement (Option 007) and reliable on–wafer measurement (Option 010) capabilities

Material measurement options provide temperature characteristics analysis capability (Option 007) and direct read function of permittivity and permeability (Option 002).

Probe station connection kit (Option 010) offers an accurate on-wafer or micro-component impedance measurement solution up to 3 GHz.

The E4991B supports a wide variety of test accessories that designed to make measurements simple and reliable.

Whether you are in R&D, QA or inspection, the E4991B is an ideal solution for characterizing and evaluating electronic components, semiconductor devices and materials.

For materials measurement, E4991B works with the N1500A-005 materials measurement suite and provides ease-of-measurements (up to 1 GHz), from setting-up fixtures to report generation.

Key Specifications

Additional Information
RF IV, suitable for accurate impedance evaluation Equivalent circuit analysis (7 models) Material meas. (opt. 002) Temperature characteristic test (opt. 007) On-wafer impedance meas. with probe station (opt. 010) 4 channels, 4 traces
Basic Accuracy
0.65%
DC Bias
0 V to ±40 V, 0 A to ±100 mA (option 001)
Frequency
1 MHz to 500 MHz/1 GHz/3 GHz
Maximum Frequency
3 GHz
Measurement
RF-IV method
Additional Information
Basic Accuracy
DC Bias
Frequency
Maximum Frequency
Measurement
RF IV, suitable for accurate impedance evaluation Equivalent circuit analysis (7 models) Material meas. (opt. 002) Temperature characteristic test (opt. 007) On-wafer impedance meas. with probe station (opt. 010) 4 channels, 4 traces
0.65%
0 V to ±40 V, 0 A to ±100 mA (option 001)
1 MHz to 500 MHz/1 GHz/3 GHz
3 GHz
RF-IV method
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Additional Information:
RF IV, suitable for accurate impedance evaluation Equivalent circuit analysis (7 models) Material meas. (opt. 002) Temperature characteristic test (opt. 007) On-wafer impedance meas. with probe station (opt. 010) 4 channels, 4 traces
Basic Accuracy:
0.65%
DC Bias:
0 V to ±40 V, 0 A to ±100 mA (option 001)
Frequency:
1 MHz to 500 MHz/1 GHz/3 GHz
Maximum Frequency:
3 GHz
Measurement:
RF-IV method
Measurement Range(Accuracy < 10%):
120 mΩ to 52 kΩ
Other Features:
Equivalent Circuit analysis, limit line test, etc. Dielectric/magnetic material measurement (option 002), Temperature characteristics measurement (option 007),
Special features:
n/a
Target DUT:
General Purpose device
Material
Type:
Impedance Analyzer
E4991B Impedance Analyzer

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