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4072A Advanced Parametric Tester

Status do Produto: Descontinuado | Com Suporte
Este produto não se encontra disponível

Esse produto foi substituído por um novo:

Principais recursos e especificações

General features

  • Supports up to 2xHPSMU and up to 8 total SMUs
  • Low-leakage switching matrix, customizable from 12 to 48 fully-guarded Kelvin outputs
  • High-frequency switching matrix with integrated pulse generator control
  • 8 auxiliary inputs and 48 extended path inputs for support of external instruments

Measurement capabilities

  • 2 microvolt and 10 femtoamp measurement resolution (MPSMU and HPSMU)
  • +/- 200 Volts and +/- 1 Amp output capability (HPSMU)
  • 1 kHz to 1 MHz capacitance frequency measurement range (using 4284A or E4980A)
  • +/- 1.6 Amp ground unit (GNDU)

HV-SPGU option measurement capabilities

  • +/-40 V output (80 V peak-to-peak) at high impedance
  • Pulse rise and fall times as fast as 20 ns
  • Three-level output pulse capability
  • Arbitrary Linear Waveform Generation (ALWG) function

Descrição

The standard support period of Keysight 4070 series will be ending on November 30th, 2018.
The Extended Service Period (ESP) will extend support for 3 years until November 30th, 2021 with certain conditions and limitations.
Extended Service Period repair service is subject to the availability of parts.

The 4082A Parametric Test System is the replacement products. Learn more at Parametric Test Solutions.

The Keysight 4072A advanced parametric tester with Keysight SPECS is designed to perform precision DC measurement, capacitance measurement, flash memory cell testing, and testing of other high-frequency applications. The system supports up to eight source monitor units (SMUs), two of which may be high-power SMUs (HPSMUs). Each SMU is self-calibrating and may be individually configured to force either current or voltage and simultaneously measure either voltage or current.