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85070M Dielectric Probe Measurement System, 3 GHz

Status do Produto: Obsoleto | Veja opções de Serviço
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Principais recursos e especificações

  • Hermetic glass-to metal seal, which makes it resistant to corrosive or abrasive chemicals
  • Withstands a wide -40° to +200° temperature range which allows measurements versus frequency and temperature
  • A special refresh calibration simplifies measurements over temperature
  • er´, er", tan delta or Cole-Cole plots; tabular listings of data
  • Hardcopy plots to plotters or graphics printers; tabular listing to printers; save/recall/export data via disk in MS-DOS® ASCII format or HP BASIC BDAT format (HP LIF binary).

Descrição

The Keysight 85070M dielectric probe measurement system lets you measure the dielectric properties of materials quickly and conveniently. Measurements made with this probe are nondestructive and require no sample preparation -- saving you time, trouble, and materials. A measurement system based on the Keysight 85070B dielectric probe yields permittivity (dielectric constant), loss factor, loss tangent, or Cole-Cole diagrams -versus frequency- from 200 MHz to 20 GHz (depending on the network analyzer and material). The Keysight 85070M is a fully configured materials measurement system consisting of the Keysight 85070B dielectric probe kit, network analyzer, cable, probe stand, and pre-configured Keysight Vectra PC.

  • Hermetic glass-to metal seal, which makes it resistant to corrosive or abrasive chemicals
  • Withstands a wide -40° to +200° temperature range which allows measurements versus frequency and temperature
  • A special refresh calibration simplifies measurements over temperature
  • er', er", tan delta or Cole-Cole plots; tabular listings of data
  • Hardcopy plots to plotters or graphics printers; tabular listing to printers; save/recall/export data via disk in MS-DOS® ASCII format or HP BASIC BDAT format (HP LIF binary).
  • MS-DOS is a U.S. registered trademark of Microsoft Corp.