Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM
Research Resources
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Nanoindentation Testing Tools
Nanoindentation Testing Tools
Nanoindenter technology provides the most advanced and dependable nano- and microscale material analysis available today.
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AFM - Atomic Force Microscopes
AFM - Atomic Force Microscopes
A wide range of high-precision atomic force microscopes (AFM). Keysight's atomic force microscope (AFM) products are designed to meet your research needs.
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Scanning Electron Microscopes
Scanning Electron Microscopes
The new Keysight 8500B FE-SEM has been optimized for low-voltage high-resolution imaging and now has integrated energy dispersive spectroscopy (EDS).The 8500B delivers consistent, reproducible performance and the industry’s lowest cost of ownership.
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Universal Testing Machine (UTM)
Universal Testing Machine (UTM)
The Keysight universal testing machine (UTM) offers researchers a superior means of nanomechanical characterization.
