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On-Wafer Measurements

Accurate DC/CV (and RF) statistical modeling of semiconductor devices requires collecting a significant amount of measured data from different wafers across several temperatures. Keysight Technologies recommends IC-CAP WaferPro as a turn-key DC/CV and RF automated characterization solution to help modeling and device engineers achieve more efficient on-wafer measurements across temperature. This new breakthrough solution is based on IC-CAP modeling software and efficiently controls DC/CV analyzers, network analyzers, probers, switching matrixes, and temperature chucks, as well as the powerful 407x and 408x Series of Keysight parametric testers.

For more information,

  • W8501EP IC-CAP Core Environment W8501EP IC-CAP Core Environment 

    W8501EP IC-CAP Core Environment

    The IC-CAP Core Environment provides data management, visualization and programming capabilities (with PEL). It includes MultiPlot & GUI studio, mathematical transforms & macros and the link to SQL Databases.

  • W8510EP IC-CAP Wafer Professional Measurement (WaferPro) W8510EP IC-CAP Wafer Professional Measurement (WaferPro) 

    W8510EP IC-CAP Wafer Professional Measurement (WaferPro)

    IC-CAP Wafer Professional Add-on perpetual software license

  • W8511BP IC-CAP Wafer Professional Measurement Bundle W8511BP IC-CAP Wafer Professional Measurement Bundle 

    W8511BP IC-CAP Wafer Professional Measurement Bundle

    IC-CAP Wafer Professional Measurement Bundle perpetual software license

  • W8520EP IC-CAP Instrument Connectivity W8520EP IC-CAP Instrument Connectivity 

    W8520EP IC-CAP Instrument Connectivity

    Support for DC, C-V, AC, Time and Noise measurements. Includes Drivers for DC Analyzers, C-V Meters and Impedance Analyzers, Network Analyzers, Oscilloscopes and Dynamic Signal Analyzers.