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We provide you with test and measurement solutions for all components of 112 Gbps serial data links – from the optical front end of a transceiver to the silicon switch.

These turn-key solutions support traceable standards validation procedures developed by Keysight experts allowing your team to focus on what they do best: innovation.

Optical Conformance Test

Related Solutions

Optical Transceiver Test

Integrated Photonics Test

112 Gbps Serial Optical Validation And Conformance Test

Conformance testing is key to the datacom industry as it ensures interoperability between silicon, modules, and optical transceivers from different vendors. Our optical transceiver test solutions combine essential hardware equipment with software applications to enable fully automated conformance testing while ensuring accurate and repeatable results.

Keysight 400G and 800G test solutions support the recommendations defined in the IEEE 802.3bs/cd/ck/cu as well as in the 800G PSM8 and the 100G Lambda mutli-source agreements (MSAs). In addition, multimode interfaces, such as those currently being defined in IEEE802.3db are supported.

The latest solutions accommodate pluggable optics with QSFP-DD800 and 112G OSFP form factors, while other software applications based on the same hardware platform address legacy speeds for SFP+ and QSFP pluggable modules, enabling a clear upgrade path and offering best-in-class investment protection.

Electrical Validation And Conformance Test Solution

112 Gbps Serial Electrical Validation And Conformance Test

A key goal for today’s high-performance chipsets is interoperability. Success with 112 Gbps electrical technology and standards will require a tremendous increase in the performance of the metrology required to support the essential measurements.

We offer the only complete 112 Gbps Tx and Rx electrical conformance test solutions for IEEE 802.3ck and OIF-CEI-112G. Our experts contribute to and closely follow standards development to guarantee you are always prepared with the correct tools and techniques to make sure that your design is on time and meets your customer’s requirements.

Our fully automated standard conformance test applications give you the flexibility needed to go beyond basic compliance. Customize tests for advanced debugging and assessing performance margins.

Electrical Conformance Test

Electrical Conformance Test Applications

N1091CKCA Electrical TX Test SW for IEEE802.3ck (100/200/400 Gb/s)

M8091CKCA Receiver Conformance Test Application for IEEE 802.3ck

N109212CA Electrical TX Test Software for OIF-CEI-112G

D90103CKC Electrical TX Test SW for IEEE802.3ck

D9050CEIC OIF-CEI-112G

Related Products

Related Products

Featured Resources

Posters 2023.06.06

Your Path to 1.6T

Your Path to 1.6T

With the advent of 800G and 1.6T, data centers and network equipment developers must familiarize themselves with a new array of interfaces, form factors, standards, and testing requirements. This poster summarizes important characteristics of electrical and optical interfaces while providing an overview of key test & measurement considerations. Additionally, you'll find useful information regarding industry drivers, standards timelines, and Keysight solutions that serve the full 800G/1.6T development cycle from design to manufacturing.

2023.06.06

White Papers 2023.06.08

TDECQ Part 1: Making Accurate and Repeatable Compliance Measurements

TDECQ Part 1: Making Accurate and Repeatable Compliance Measurements

TDECQ is the acronym used to describe “transmitter dispersion and eye closure quaternary”. This is a power penalty metric that describes how much extra power is required from a transmitter, relative to an ideal transmitter, to compensate for both non-ideal transmitter waveforms and the impact of chromatic dispersion. It is similar to the transmitter dispersion penalty (TDP) metric used in NRZ optical communications standards. It was developed in the IEEE 802.3bs standard and improved in the IEEE 802.3cd standard. It is a convenient way to specify the performance of a PAM4 transmitter, as it aggregates many transmitter attributes into a single metric, and the metric directly indicates the impact a transmitter’s imperfections will have on overall system-level performance.

2023.06.08

White Papers 2023.11.27

TDECQ Part II Manufacturing Test Recommendations

TDECQ Part II Manufacturing Test Recommendations

This document gives an overview of the adoption of TDECQ in manufacturing tests, and how to efficiently automate FlexDCA for making TDECQ measurements.

2023.11.27

White Papers 2020.09.01

How to Shorten Compliance Test Time with Software

How to Shorten Compliance Test Time with Software

Each new generation of high-speed computing standards includes more tests and factors to consider. This white paper discusses four ways to use software to accelerate your compliance testing.

2020.09.01

Technical Overviews 2020.04.19

PAM-4 Measurement SDK and Resource Arbiter

PAM-4 Measurement SDK and Resource Arbiter

This technical note describes how measurement throughput can be increased by the disaggregation of test signal acquisition and signal analysis and by the parallelization of several analysis processes in automation of transceiver test. Using the N1094BS1A PAM-4 measurement SDK you can calculate the key eye diagram TDECQ, OMA, OER, eye linearity, eye width, eye skew on powerful physical or virtual machines.

2020.04.19

Application Notes 2023.11.20

Conformance Testing of 800G Ethernet Links for the Data Center

Conformance Testing of 800G Ethernet Links for the Data Center

This application note will cover the changes in requirements between 400G and 800G electrical interfaces and how Keysight Technologies Transmitter and Receiver Conformance Test Solutions allow users to easily perform design validation testing and explore their design margins.

2023.11.20

Application Notes 2021.09.27

Experimental Validation for a 100 Gb/s Per Lane C2M Hyperscale Link Using Channel Operating Margin

Experimental Validation for a 100 Gb/s Per Lane C2M Hyperscale Link Using Channel Operating Margin

Physical Layer Testing of Chip-to-Module Link.

2021.09.27

Application Notes 2021.11.08

100 Gb/s System Level Electrical Signaling Impact from EM Modal Artifacts in Hyperscale Networks

100 Gb/s System Level Electrical Signaling Impact from EM Modal Artifacts in Hyperscale Networks

This white paper will educate the reader about how mode conversion in differential channels can affect internet infrastructure physical layer adversely.

2021.11.08

Solution Videos

Video 2021-10-07

Webinar: Physical Layer Validation Challenges in Characterizing 100 Gbps Lane Designs

Webinar: Physical Layer Validation Challenges in Characterizing 100 Gbps Lane Designs

Webinar: Physical Layer Validation Challenges in Characterizing 100 Gbps Lane Designs.

2021-10-07

Demo 2021-11-30

Transmitter Test For Next-Gen Multimode Datacom Transceivers

Transmitter Test For Next-Gen Multimode Datacom Transceivers

The evolution of Capex and power consumption for networking is of significant concern to data center operators. Next-generation multimode pluggable modules are addressing this very critical issue. Keysight’s expert Dr. Hadrien Louchet first discusses how key performance metrics such as bit error rate, frame loss ratio can be measured with the A400GE-QDD multiport tester. He then focuses on a critical step of optical module validation, the optical transmitter test, and shows how Keysight combines the N1077B Multimode Optical/Electrical Clock Recovery and the N1092x Series of DCA-M sampling Oscilloscope to carry out accurate measurements on multimode design with a very low margin. As interoperability is and remains a must, accurate validation and conformance test solutions are necessary prior to the large-scale deployment of this low footprint technology.

2021-11-30

Demo 2021-10-01

How to Test the Upcoming Optical Interface Running at 100 Gbits over a Single Multimode Fiber

How to Test the Upcoming Optical Interface Running at 100 Gbits over a Single Multimode Fiber

The industry is working on a low-footprint optical interface for data centers to address the accelerating digital transformation of society. This technology pushes the capabilities of low-cost and power-efficient multimode fiber laser sources such as VCSEL to their limits to operate at 53Gbaud PAM4. Keysight Technologies is on the cutting edge of data innovation with its Multimode Test Solution portfolio. Our expert Dr. Hadrien Louchet discusses the challenges and solutions for testing this new optical interface.

2021-10-01

Demo 2021-07-02

100G Electrical Receiver Test Application for IEEE 802.3ck - Overview

100G Electrical Receiver Test Application for IEEE 802.3ck - Overview

Keysight’s M8091CKPA test application offers the industry’s first electrical receiver pre-conformance solution for the 100Gbps serial and aggregated speed interface defined in the IEEE 802.3ck standard. It is designed and developed to assist in simplifying the calibration and testing of electrical inputs of chip-to-chip (C2C) and chip-to-module (C2M) using Keysight M8040A High-performance BERT and DCA Sampling Oscilloscopes. The application offers accurate and repeatable receiver tests following the IEEE 802.3ck recommendations to ensure interoperability between the next generation of datacom devices. With remote-controlled capabilities of the automated stress signal calibration and pre-conformance measurement, the M8091CKPA application provides robust and repeatable test outcomes which reduce user interaction to a minimum.

2021-07-02

Demo 2020-12-04

100G Electrical TX and RX Conformance Test Solution – Overview

100G Electrical TX and RX Conformance Test Solution – Overview

Keysight’s new pre-conformance test solution simplifies the testing of 100Gb/s electrical interfaces by automating over 120 transmitter measurements and receiver test procedures for chip-to-module (C2M) and chip-to-chip (C2C) interfaces.

2020-12-04

Demo 2021-06-22

100G Serial FEC-Aware Conformance Testing

100G Serial FEC-Aware Conformance Testing

Keysight demos a physical design validation solution for 800G components and transceivers. 100G electrical interfaces such as those defined by the IEEE 802.3ck and OIF-CEI 112G standardization bodies are the workhorse of next generation datacenter. As 53Gbaud PAM4 interface design margins are shrinking, the need for accurate in-depth design validation has increased tremendously. The solution consists of the M8040A BERT, combined with the G800GE multichannel tester. It is designed to integrate FEC constraints into the physical design validation and compliance testing. For more information go to https://www.keysight.com/find/800g

2021-06-22

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