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    • N1953A Physical Layer Test System, 45 MHz to 20 GHz [Obsolete]

    N1953A Physical Layer Test System, 45 MHz to 20 GHz

    Product Status:
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    N1953B Physical Layer Test System, 10 MHz to 20 GHz
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    HIGHLIGHTS

    • Powerful analysis tools include time-domain reflectometry (TDR), time-domain transmission (TDT), frequency-domain and eye diagrams
    • Complete characterization of single-ended, differential-mode, common-mode, and mode-conversion of your device
    • E8362B PNA series vector network analyzer with Option 014
    • RLCG parameter extraction allows creation of accurate transmission-line models for use in simulation programs such as HSPICE
    • N4419A 20 GHz test set
    • VNA´s > 70-dB dynamic range provides accurate characterization of your device
    • N1930A physical layer test system software
    • De-embedding removes test fixture effects from the measurement

    The Keysight N1953A physical layer test system provides the highest accuracy and most comprehensive approach for characterizing single-ended or differential physical layer components such as high-speed backplanes, cables, connectors, packages, and controlled impedance traces on circuit boards.

    The N1953A physical layer test system includes:

    • E8362B PNA series vector network analyzer with Option 014
    • N4419A 20 GHz test set
    • N1930A physical layer test system software

    Note: Each component of physical layer test systems is available seperately if you already own a compatible vector network analyzer and would like to build a system. Please refer to the product overview for details.

    • Powerful analysis tools include time-domain reflectometry (TDR), time-domain transmission (TDT), frequency-domain and eye diagrams
    • Complete characterization of single-ended, differential-mode, common-mode, and mode-conversion of your device
    • RLCG parameter extraction allows creation of accurate transmission-line models for use in simulation programs such as HSPICE
    • VNA's > 70-dB dynamic range provides accurate characterization of your device
    • De-embedding removes test fixture effects from the measurement
    • Easy to use and intuitive Windows®-based user interface
     
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