EXT Wireless Communications Test Set

Get your latest wireless devices to market faster

Wireless technologies are evolving rapidly and more wireless bands and formats are being implemented on chipsets, smartphones, and other wireless communication devices. Manufacturers are looking for fast and cost-effective ways to produce these complex devices. Reducing the time and cost of test will go a long way toward achieving this goal.

Non-signaling is widely accepted as the fastest, most cost-effective technique for testing next-generation wireless devices in manufacturing. By taking advantage of test modes built into the new chipsets, non-signaling test can eliminate costly signaling overhead from the manufacturing test process, increasing throughput while maintaining the integrity of the test and quality of the finished product.

The Keysight Technologies, Inc. EXT is the only one-box test set designed and optimized solely for non-signaling test in wireless device manufacturing. Its integrated hardware and

innovative, industry-leading software tools provide the fastest route from pre-production through high-volume manufacturing.

Using the E6617A multiport adapter, the EXT’s capacity expands to provide eight fully calibrated RFIO interfaces and four GPS ports, enabling parallel device testing, dramatically increasing the production throughput, and further reducing the cost of test. The EXT is your best choice for calibration and verification measurements:

• Integrated one-box test set combines a vector signal analyzer, vector signal generator, test sequencer, multiport adapter, and modern, scalable platform.
• Fast measurements and flexible sequencer techniques work in synch with your device’s chipset test modes to execute test plans at the highest speed for maximized throughput.
• Unique, graphical Sequence Studio software dramatically streamlines test plan creation and troubleshooting, saving code development time to move from NPI to volume manufacturing.
• Fast, standards-based measurements and modulation analysis capability are based on proven Keysight X-Series measurement algorithms—add new formats quickly.
• Save time and lower the cost of manufacturing test with the industry’s most flexible, accurate, future-proof solution.

An easier transition

The EXT works in conjunction with chipset test modes using fast measurements and flexible sequencer techniques to speed calibration and verification of your devices and modules. With the EXT’s tools to facilitate test plan development and execution, the need for additional chipset vendor support is minimized, making your transition to non-signaling test easy and efficient. And if you need additional support, you’ll have the backing of the field and factory application experts from the world’s metrology leader.

Future-ready

Keysight’s solution is integrated into most of the main stream chipset vendors’ manufacturing software tools and we continue work with chipset vendors to help shape the test modes of the future to ensure that the EXT is ready to test next-generation wireless devices.

Key EXT benefits

Anticipate your wireless device manufacturing test needs

Multiple formats

Tests new and existing radio formats including LTE TDD/FDD, W-CDMA, HSPA+, cdma2000®/1xEV-DO, TD-SCDMA, Bluetooth®, WiMAX™ and more

Full cellular band coverage

Supports up to 3.8 GHz for LTE TDD band 43 with standard EXT configuration

Lower costs

Architecture optimized for lower-cost non-signaling test with superior hardware and software scalability

Accelerate test development

Simplify

Creates standards-based waveform files to control and test your wireless devices

Streamline

Reduces engineering time required to develop and troubleshoot non-signaling test plans for volume manufacturing

Turnkey

Remains current with wireless chipsets now and in the future through collaboration between Keysight and chipset vendors

Achieve fast and accurate measurements

Speed

Reduces test time and increases manufacturing throughput with advanced test sequencer, single acquisition, multiple measurements, and multi-technology sweeps

Accuracy

Delivers high first-pass yields and measurement confidence with repeatable results that are accurate to industry standards

Parallel test

Unique multiport adapter enables simultaneous device receiver testing for maximum manufacturing throughput