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Reduce Test Time, Reduce Cost: Data Center Component and Transceiver Test

Reduce Test Time, Reduce Cost: Data Center Component and Transceiver Test

白皮書

Test time contributes significantly to overall transceiver cost. Learn how more efficient testing of the broad range of transceiver data rates accelerates innovation and lowers cost. The process begins in the research and development phase with the design of transceiver components, continues to the design and validation of the transceivers, and then through to manufacturing test.

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