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E4980AU-007 Standard Model

제품상태: 주문가능 | 기술지원 가능

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현재 펌웨어/소프트웨어

버젼: A.06.17
릴리스 날짜: 2018-08-22

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E4980A Precision LCR Meter, E4980AL Precision LCR Meter - Data Sheet
This document provides specifications for the E4980A precision LCR meters.

데이터시트 2018-04-13

E4980A/E4980AL Precision LCR Meters - Configuration Guide
This configuration guide describes standard configurations, options, accessories and upgrade information for the E4980A Precision LCR Meter.

구성 가이드 2018-02-14

PDF PDF 926 KB
E4980A/AL Precision LCR Meter Users Guide
This manual describes most of the basic information needed to use the E4980A and E4980AL. It provides the information of operation, programming and specifications.

사용자 매뉴얼 2017-10-31

Accessories Catalog for Impedance Measurements - Catalog
This catalog introduces all the impedance test fixtures that can be used with LCR meters, Resistance Meters, Capacitance Meters, Impedance Analyzers, and Combination analyzers. ADDITIONAL MODELS: 16196A 16196B 16196C 16197A 16064B 16190B 16380A 16380C 42030A 42090A 42091A

선택 가이드 2017-08-24

E4980A/ E4980AL Precision LCR Meter Service Guide
This Service Guide is a guide to servicing the E4980A & E4980AL 20Hz to 300kHz/ 500kHz/ 1MHz/ 2MHz Precision LCR Meter. The Service Guide provides information about performance test, adjustment, troubleshooting, and repairing the instrument.

서비스 매뉴얼 2015-09-01

PDF PDF 7.03 MB
E4980A Security Features
This document describes instrument security features and the steps to declassify an instrument through memory sanitization or removal.

참조 가이드 2014-10-01

PDF PDF 144 KB
LCR 미터, 임피던스 분석기, 테스트 픽스처 선택 가이드
LCR 미터, 임피던스 분석기 및 테스트 픽스처 - 소재, 반도체, 콤포넌트 및 In-Circuit 솔루션

선택 가이드 2014-06-02

임피던스 측정 핸드북

어플리케이션 노트 2012-07-06

Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Keysight 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

어플리케이션 노트 2008-12-10

Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.

어플리케이션 노트 2008-11-21

MEMS/NEMS 디바이스 측정 솔루션
키사이트는 MEMS/NEMS 디바이스의 특성 분석을 도와 줍니다.

어플리케이션 노트 2008-06-04

Improving the Test Efficiency of the MEMS Capacitive Sensor using the E4980A
This application brief describes the features of the Keysight E4980A and how it can dramatically improve the test efficiency of MEMS capacitive sensors.

어플리케이션 노트 2007-04-13

Improving Test Efficiency of MEMS Electrostatic Actuator using the E4980A
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of MEMS electrostatic actuators.

어플리케이션 노트 2007-04-12

Characterizing Electromagnetic MEMS Optical Scanner using the E4980A
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of electromagnetic MEMS optical scanners.

어플리케이션 노트 2007-04-04

Characterizing Electromagnetic MEMS Optical Switch Actuator using the E4980A
This application brief describes how the Keysight E4980A improves the test efficiency of electromagnetic MEMS optical switch actuators.

어플리케이션 노트 2007-04-04

Improve Electronic Product Quality and Performance with Keysight Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Keysight's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.

어플리케이션 노트 2006-06-26

E4980A Precision LCR Meter Video Demo
View an overview of the LCR, application examples, and more!

기본 데모 2006-05-19