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U9401B Medalist i1000D

Product Status: Currently Orderable | Currently Supported

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Medalist i1000D In-Circuit Test System Family - Data Sheet
Keysight Medalist i1000D redefines digital test to provide electronics manufacturers with user-friendly and affordable testing for digital devices. The Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards with a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.

Data Sheet 2018-08-25

PDF PDF 4.07 MB
Medalist i1000D Small Foot Print In-Circuit Test - Technical Overview
The Keysight Medalist i1000D is now fully automated with in-line capabilities. It is the smallest foot print in-circuit tester for PCBA lines.

Technical Overview 2017-12-01

Medalist i1000D In-Circuit Test System - Data Sheet
The Keysight Medalist i1000D in-circuit tester (ICT) redefines digital testing by bringing electronics manufacturers easy to use and affordable testing for digital devices.

Data Sheet 2017-07-31

Understanding the Operation and Usage of Manufacturing Execution Systems - Technical Overview
This paper gives an overview of how typical manufacturing execution systems work on the production floor, with examples of MES connectivity with shopfloor clients to enable specific applications

Technical Overview 2015-04-28

PDF PDF 1.81 MB
Shopfloor Operation of the Keysight i1000 In-Circuit Test Software - Application Note
This application note helps developers of the shopfloor client to fully understand the format and behavior of the i1000 software files to enable communication between the i1000 and the client.

Application Note 2015-04-16

PDF PDF 1.24 MB
Reducing Cost of Testing Prototypes with the Keysight Medalist i1000D In-Circuit
This case study challenges the conventional adoption of flying probers for board testing at the NPI stage, offering the Keysight Medalist i1000D as a viable option which can help save time and money.

Application Note 2014-08-01

In-Circuit Test (ICT): The King Is Dead; Long Live the King! - Article Reprint
Reports of the demise of in-circuit testing have been exaggerated for at least 20 years. Despite this, ICT is still here and kicking. This paper discusses various reasons why the King lives on.

Article 2014-08-01

PDF PDF 201 KB
Converting Tescon Point 70 Fixtures and Programs for use on the Medalist i1000D
This application describes how users can convert their hardware and software from the Tescon Point 70 platform to the Keysight Medalist i1000D platform to enjoy state-of-the-art in-circuit test technology .

Application Note 2014-07-31

PDF PDF 8.81 MB
Expanding Coverage with Boundary Scan - Article Reprint
Limited access tests can expand or leverage on boundary scan and provide more test coverage for a myriad of devices, beyond just boundary scan device coverage.

Article 2012-08-24

PDF PDF 152 KB
ICT Total Cost of Ownership - Article Reprint
This article examines how the total cost of ICT ownership continues to change. It discusses the factors that a manufacturer should consider before making an investment.

Article 2012-08-24

PDF PDF 301 KB
The Value of the in-Circuit Tester - Article Reprint
This article discusses how in-circuit testers for PCBAs can play a significant role to enhance product value and increase production efficiency for electronics manufacturers.

Article 2012-08-24

PDF PDF 1.04 MB
Changes in Test Coverage - Article Reprint
This article discusses challenges behind in-circuit testing on modern-day high speed, high complexity PCBAs, and work-around solutions currently available.

Article 2012-08-24

PDF PDF 235 KB
i1000D Diagnostics Test Set - Technical Overview
The Keysight i1000 diagnostics test set (DTS) provides boundary scan, on-board programming and general digital test in a desktop form factor that makes it easy to deploy for a flexible test strategy.

Technical Overview 2012-03-26

Medalist i1000D with Board Handler - Application Note
The i1000D with JET board handlers enables low-cost ICT in a fully automated environment, with reduced labor cost while enabling higher test coverage for components on today's complex PCBAs.

Application Note 2011-10-03

Medalist i1000D Boundary Scan Debug
This white paper discusses how to effectively debug boundary scan tests on the Medalist i1000D in-circuit tester.

Application Note 2011-08-01

PDF PDF 896 KB
Latin America: Pushing the Boundaries of Test-Article Reprint
A first-hand stock taking of the EMS scene in Brazil and Mexico from an engineer's road trip.

Article 2011-01-13

PDF PDF 966 KB
Make the Move From MTS 160 To Medalist i1000D In-Circuit Test Application Note
This application note describes how to convert the hardware and software from the MTS160 MDA platform to the Keysight Medalist i1000D platform to use state-of-the-art in-circuit test technology.

Application Note 2010-10-22

PDF PDF 3.27 MB
Medalist i1000 In-Circuit Test Solution Flash Demo
View the Keysight Medalist i1000 low cost ICT flash demo to see how this low cost solution offers you just enough test while giving you with extended test coverage capabilities that typical MDAs cannot provide.

Demo 2008-02-13

ZIP ZIP 46.08 KB