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5500 Atomic Force Microscope (AFM) (N9410S)

Product Status: Currently Orderable | Currently Supported

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Current Firmware/Software

Version: PicoView
Release Date: 2012-12-18

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Imaging with self-sensing cantilever on Keysight 5500/5600LS Atomic Force Microscopes - App Note
In this collaborative work, a brief technical background of self-sensing cantilevers and the developed Convert Unit for Keysight 5500/560LS AFM systems is introduced.

Application Note 2017-08-21

PDF PDF 5.16 MB
Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity -App Note
Wideband electrostatic force microscopy that extends the available EFM frequency range from the kHz to the GHz range as well as the measuring capabilities, which works in tapping or lift mode therefore reduces the tip wear and sample modifications.

Application Note 2017-08-21

PDF PDF 598 KB
5500 Atomic Force Microscope (AFM) - Data Sheet
Data sheet for the 5500 AFM/SPM Microscope with features & benefits and options

Data Sheet 2017-03-29

KFM & CSAFM, Environmental Control in Fuel Cell Research for the Automotive Industry - App Note
Explanation of two AFM modes used in automotive research for fuel cells

Application Note 2017-02-21

PDF PDF 1.75 MB
AFM/SPM Accessories - Brochure
Catalog of all AFM accessories and options

Brochure 2016-09-22

PDF PDF 4.63 MB
Scanning Microwave Microscopy for Quantitative Imaging of Biological Samples Including Live Cells
The use of Scanning Microwave Microscopy with AFM for quantitative imaging of biological samples including live cell imaging.

Application Note 2016-08-30

PDF PDF 2.89 MB
Scanning Microwave Microscopy Solutions for Quantitative Semiconductor Device Characterization
Discussion of Scanning Microwave combined with Atomic Force Microscopy for calibrated measurements for Semiconductor devices

Application Note 2016-07-15

PDF PDF 3.31 MB
Post Processing Pico Image Software for Keysight AFM Systems - Data Sheet
Pico Image surface imaging and analysis software is dedicated to Keysight AFMs and SPMs. It contains three levels for basic, advanced, and expert users. Standalone and network licenses are available.

Data Sheet 2016-07-02

PDF PDF 2.89 MB
Advanced Nanomeasurement Solutions - Brochure
High level nanotechnology brochure discussing AFM, FE-SEM and Nanomechanical Testing Systems capabilities across industries and research areas.

Brochure 2016-05-06

PDF PDF 7.07 MB
Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

Application Note 2016-03-11

PDF PDF 7.96 MB
Atomic Force Microscopy Studies in Various Environments - Application Note
Overview of using the environmental chamber with water, humidity and gaseous vapors in Polymer research

Application Note 2015-03-23

PDF PDF 5.80 MB
Compositional Mapping of Materials with Single Pass Kelvin Force Microscopy - Application Note
Applications of single-pass KFM showing that the mode complements phase imaging in compositional mapping of complex materials.

Application Note 2015-03-13

PDF PDF 8.09 MB
High Resolution Scanning Probe Microscopy in Controlled Environments - Application Note
This Application Note reports investigations involving high resolution SPM experiments with Keysight Technologies SPMs working in a glove box environment without compromising the SPM performance.

Application Note 2015-02-02

PDF PDF 1.57 MB
Electrical Measurement - Application Note
Overview of electrical measurements using AFM in various modes

Application Note 2014-12-15

PDF PDF 4.11 MB
How to choose your MAC Lever - Technical Overview

Technical Overview 2014-12-09

PDF PDF 168 KB
Attaching Antibodies to MAC Levers with the Bifunctional Amine-Amine Reactive PEG Tether - App Note

Application Note 2014-12-08

PDF PDF 742 KB
Attaching Antibodies to AFM Probes with Sulfhydryl Reactive PEG Tether NHS-PEG18-PDP - App Note

Application Note 2014-12-08

PDF PDF 329 KB
Temperature Control - Data Sheet

Data Sheet 2014-11-17

PDF PDF 491 KB
Liquid Cell and Sample Plate - Data Sheet

Data Sheet 2014-11-06

PDF PDF 891 KB
PicoLITH, Keysight Lithography and Nanomanipulation Package – Data Sheet
Lithography and nanomanipulation software that provides for scanning probe microscopy (SPM) researchers. It allows users to sketch various shapes on a canvas (including lines, poly-lines, circles) that can then be mapped to a real sample surface.

Data Sheet 2014-11-03

PDF PDF 491 KB
MAC Mode - Data Sheet

Data Sheet 2014-11-03

PDF PDF 1.08 MB
New Investigations into Energy: Keysight Nanomeasurement Systems - Application Note
The data presented demonstrates just a few of the ways in which the latest atomic force microscopy (AFM), nanoindentation, and field-emission scanning electron microscope can be utilized to enhance energy-related materials research.

Application Note 2014-04-24

PDF PDF 2.58 MB
Friction, Phase and KFM Characterization of Functionalized Graphene Oxide

Application Note 2012-08-09

PDF PDF 443 KB
Graphene Oxide & Its Applications Revealed by Atomic Force Microscopy

Application Note 2012-06-27

PDF PDF 305 KB
Quantitative Surface Potential Measurement Using KFM - Application Note

Application Note 2012-04-20

PDF PDF 360 KB

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