Choose a country or area to see content specific to your location
-
PRODUCTS AND SERVICES
- Oscilloscopes
-
Analyzers
- Spectrum Analyzers (Signal Analyzers)
- Network Analyzers
- Logic Analyzers
- Protocol Analyzers and Exercisers
- Bit Error Ratio Testers
- Noise Figure Analyzers and Noise Sources
- High-Speed Digitizers and Multichannel DAQ Solutions
- AC Power Analyzers
- DC Power Analyzers
- Materials Test Equipment
- Device Current Waveform Analyzers
- Parameter / Device Analyzers and Curve Tracers
- Meters
- Generators, Sources, and Power Supplies
- Software
- Wireless
- Modular Instruments
- Network Test and Security
- Network Visibility
- Services
- Additional Products
- All Products, Software, Services
- Learn
- Buy
- Support
- Home
- Resources
- Resources
What are you looking for?
IC-CAP Key Features
Integrated Circuit Characterization and Analysis Program (IC-CAP) is the industry standard software for DC and RF semiconductor device characterization and modeling. IC-CAP extracts accurate compact models for use in high speed/digital, analog and power RF applications. IC-CAP offers device engineers and designers a state of-the-art modeling tool that fills numerous modeling needs, including automated instrument control, data acquisition, parameter extraction, graphical analysis, simulation, optimization, and statistical analysis.
All of these capabilities are combined in a flexible, automated and intuitive software environment for efficient and accurate extraction of active, passive and user-defined devices and circuits. Today’s most advanced semiconductor foundries and Integrated Device Manufacturers (IDMs) rely on IC-CAP for modeling silicon CMOS, Bipolar, compound gallium arsenide (GaAs), gallium nitride (GaN), and many other device technologies.
For more information about IC-CAP, download the IC-CAP Brochure.
Key Features
- Open software architecture enables you to achieve maximum accuracy by integrating your own modeling expertise and methodologies, and provides ultimate flexibility to create and automate measurement, extraction and verification procedures.
- Turnkey extraction solutions for industry standard CMOS models, such as BSIM3/BSIM4, PSP, HiSIM, and HiSIM_HV minimize the learning curve and maximize model accuracy.
- Unique nonlinear high-frequency modeling with Keysight HBTs, Root models, high frequency BJT, MESFET, PHEMT, and state-of-theart VerilogA models.
- Direct links to most commercial simulators (e.g., ADS, HSPICE, Spectre, and ELDO) ensure consistency between extracted models and the simulators used by circuit designers.
- The most advanced and complete on-wafer automated measurement and characterization environment with IC-CAP Wafer Professional.
- Powerful data handling capabilities.
Learn how to use IC-CAP to extract the following types of models:
Learn more about:
- Device Modeling
- Device Model Support
- Recommended Modeling Configurations for Device Modeling
- Software Versions, Computer Platforms, and Operating Systems
Return to IC-CAP Device Modeling Software.
- © Keysight Technologies 2000–2024
- Privacy
- Sitemap
- Terms
- Trademark Acknowledgements
- Feedback
- Accessibility