D9040DDRC DDR4 and LPDDR4 Compliance Test Software

D9040DDRC DDR4 and LPDDR4 Compliance Test Software

The Keysight Technologies, Inc. DDR4 and LPDDR4 compliance test application provides a fast and easy way to test, debug and characterize your DDR4 and LPDDR4 designs. The tests performed by the D9040DDRC software are based on the JEDEC DDR4 and LPDDR4 Specification. In addition, the application features Custom mode, which covers crucial measurements such as eye-diagram, mask testing, ringing and other tests that are not covered in the specifications but are critical for characterizing DDR4 and LPDDR4 devices. The test application offers a user- friendly setup wizard and a comprehensive report that includes margin analysis.

Features

The DDR4 and LPDDR4 compliance test application offers several key features to simplify the validation of your designs.

• Intuitive setup wizard for quick test setup, configuration and test.

• AI assisted voltage threshold finding for robust read/write cycle separation.

• DDR4 MSO logic channel trigger option to trigger command protocol.

• Comprehensive test coverage of the DDR4, LPDDR4 (LPDDR4x and LPDDR4y) electrical, timing and eye diagram tests.

• Ability to analyze the loading effect of adjacent RANK of the same memory channel.

• Powerful characterization through multiple trials that show a full array of statistics for each measurement and returns the worst measurement value.

• DDR debug tool allows for navigation to areas of interest in a saved set of waveforms with JEDEC measurement for pre- and post-compliance testing, which includes electrical, timing and multiple eye diagram analysis.

• Offline setup allows for compliance testing on saved waveform files from oscilloscope or ADS simulation tool.

• Easy interface to export the test result to the KS6800A series Data Analytics repository for quick analysis with the web-based analytics tool.

Comprehensive Test Coverage

The DDR4 and LPDDR4 validation test application allows you to use the oscilloscope to perform automated testing and margin analysis on your design. The application automatically configures the oscilloscope for each test and provides informative test result. It includes margin analysis indicating how close your device comes to passing or failing each test parameter. The DDR4 and LPDDR4 compliance test automates the measurement as specified in the specification, which helps save test time and design cost.

Easy Test Definition

The DDR4 and LPDDR4 compliance test application automatically configures the oscilloscope for each test and provides information test results which includes margin and statistical analysis. The tests coverage includes electrical, timing and eye diagram tests as stated in the JEDEC specification. The signal is optimized for most accurate test result and measurement repeatability. If you discover a problem with your device, the Custom mode feature and debug tool are available to aid in root-cause analysis. DDR debug tool that enables JEDEC measurement on saved waveform traces with navigation capability and markers to identify problem areas for debug and margin testing. You can also perform multiple eye diagram analysis using saved waveform files or output from ADS simulation software.

Configurability and Guided Connection

The DDR4 and LPDDR4 compliance test application provides flexibility in your test setup. The application lets you define controls for critical test parameters such as voltage threshold values, number of waveforms used for analysis and customizable violation settings. Once you have configured the tests, the connection page will display the connection diagram for the test you have selected.

You can also specify the number of test trials and only stop running selected tests when the stop condition is met. The application will save the worst-case test result to help you track down the anomalies in your signals.