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D9010UHSC SD UHS-II Compliance Test Software

Data Sheets

D9010UHSC SD UHS-II Compliance Test Application Software

The Keysight Technologies, Inc. SD UHS-II compliance test application provides a fast and easy way to test, debug and characterize your SD UHS-II designs. The tests performed by the SD UHS-II compliance test software are based on the SD1 version 4.0 specifications. The test application offers a user friendly setup wizard and a comprehensive report that includes margin analysis. The next-generation SDXC memory card specification with increased bus interface of UHS-II speeds up to 1.56 GB per second or higher, dramatically improves consumers’ digital lifestyles by increasing storage capacity to 2 TB. The compliance test offers reference clock tests and host and device transmitter tests. The compliance test covers signal quality and common mode voltage tests for both host and device transmitter tests. The SD UHS-II compliance test application is compatible with Keysight 90000 Series Infiniium oscilloscopes.

Features

• Setup wizard for quick setup, configuration and test selection.

• Execution speed and proven test algorithm which minimizes test time.

• User-select tests and configuration based on the SD 4.0 specification.

• Use with M8020A high performance serial BERT to manually generate test patterns like the PRBS 2^7-1 pattern that is looped back from the UHS-II device to the oscilloscope for signal integrity test.

• Test framework that reports multi trial results with full array of statistics for each measurement with worst case measurement result.

• Offline capability to allow user to run the compliance test with saved waveforms files from device

Comprehensive Test Coverage

With the SD UHS-II compliance test application, you can use the same oscilloscope you use for everyday debugging to perform automated testing and margin analysis based on the host and device transmitter physical layer specification. The application automatically configures the oscilloscope for each test and provides informative results. It includes margin analysis indicating how close your device comes to passing or failing the test for each specification. Some of the difficulties in performing the compliance tests are connecting to the target device, configuring the oscilloscope, performing the tests and analyzing the measured results. The SD UHS-II compliance test application does most of this work for you.

Easy Test Definition

The test application enhances the usability of Keysight Infiniium oscilloscopes for testing SD UHS-II devices. The Keysight automated test framework guides you quickly through the steps required to define the setup, perform the tests and view the test results. You can select a category of tests or specify individual tests. The user interface is designed to minimize unnecessary reconnections, which saves time and minimizes potential operator error. You can save the tests and configurations as project files and recall them later for quick testing and review of previous results. Clear menus let you perform tests with minimum mouse clicks.

Configurability and Guided Connection

The SD UHS-II compliance test application provides flexibility in your setup. The SD UHS-II compliance test application provides you with user-defined controls for critical test parameters such as sampling rate, number of UIs used for analysis and setting for signal ended or differential connection types. Once you have configured the tests, the connection page will display the connection diagram for the test you have selected. With multiple test trial capability, you can extensively characterize the performance of your SD UHS-II devices. You can run the selected tests until the stop condition is met. The application will then save the worst-case conditions and help you track down the anomalies in your signals.

The SD UHS-II compliance test reports the margin and you can specify the limits at which warnings are to be issued. You are provided with a full array statistic for each measurement, and you can save worst case conditions to extensively test the performance of your device.

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