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Application Notes
IL De-embedding
The Keysight Photonic Application Suite (PAS) software engines, widely used for parametric measurements of optical-to-optical and optical-to-electrical devices, have functionality to simplify system calibration in test solutions with multiple optical paths, to support use of optical switches, splitters and especially optical probes for measuring wafers and chips. Originally and still in the IL/PDL engine, this is now available for a wider range of measurements with the Lambda Scan engine (LS).
This functionality, labeled “IL De-embedding”, provides for measuring the wavelengthdependent insertion loss (IL) for the various path segments relative to a common reference, usually during the initial installation or later modification of the test station. The resulting data, or equivalent calibration data obtained in another way, are then saved and can be applied to the corresponding device port measurements. These test station calibration data can retain validity over long duration when the corresponding paths are stable, as when using switches with high repeatability and when avoiding changes of fiber connections.
This note gives an example to illustrate how IL de-embedding can be used.
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