Column Control DTX

Solving Your IoT Wireless Design and Test Challenges

Brochures

Solving Your IoT Wireless Design and Test Challenges

The Internet of Things (IoT) and its adoptions will continue to evolve in a very fast pace, with Gartner1 forecasting that endpoint devices will grow at 31% to reach 20.4B units in year 2020. IoT is going to have major impact in our life. It will make our world a better place to live in, improve our health and improve business and daily operational efficiencies. The fundamental of this growth is the connectivity behind all these devices, which need to be properly tested to ensure robust connectivity in their intended operating environments. Many wireless standards and technologies have emerged to support a wide variety of IoT applications. These range from connecting simple wearable devices to a cell phone via Bluetooth®, to mission-critical services that require constant, reliable, and secure connections. Wearable and smart home applications centered around the smartphone often use Bluetooth, ZigBee® and Z-Wave, which offer a robust and low-power mesh network. Low power wide area networks (LPWAN) are growing to support a greater number of connected devices over longer distances with very low power consumption. LPWAN technologies such as LoRa®, NB-IoT or Cat-M1 are ideal for smart city or industrial IoT applications whereby a large number of devices or sensors in a wide area can be connected cost-effectively.

Your Challenge: Ensure IoT device wireless performance while maintaining low cost-of-test

Billions of devices will be connected over many different and emerging wireless technologies, causing manufacturers to face constant challenges. These include ensuring the performance of the product and interoperability, meeting throughput, fulfilling power and range requirements, and addressing how to run the required tests quickly and inexpensively given the high volume and low market cost expectation. With many wireless technologies using the same unlicensed spectrum, manufacturers also need to verify that co-channel and adjacent-channel interferences are not adversely affecting their device performance. This also presents challenges to designers as the design and test of devices becomes more complex, time consuming, and expensive. It is important to choose a test solution that is able to meet your requirements. Tradeoffs must be made between what you want to test and what you can afford to test to ensure the quality and reliability of the device while maintaining a low cost-of-test.

Test Your IoT Devices More Efficiently

Keysight can help. From our founding in Hewlett and Packard’s garage over 75 years ago, we’ve kept an unwavering focus on solving complex measurement challenges for engineers around the world. Keysight offers a wide range of wireless test solutions, from cost-effective bench solutions to high-performance signal generators and signal analyzers for comprehensive frequency domain, time domain and modulation analysis. Keysight wireless connectivity solutions cover all your testing needs from R&D to design verification to compliance testing to high-volume manufacturing.

×

Please have a salesperson contact me.

*Indicates required field

Preferred method of communication? *Required Field
Preferred method of communication? Change email?
Preferred method of communication?

By clicking the button, you are providing Keysight with your personal data. See the Keysight Privacy Statement for information on how we use this data.

Thank you.

A sales representative will contact you soon.

Column Control DTX