Battery Material Evaluation

[Battery Material Evaluation] Impedance Distribution Measurement Using High Frequencies Enables Observation of Electrode Uniformity and Deterioration

(New Electrode Observation Method Integrating an AFM (Atomic Force Microscope) and a VNA (Vector Network Analyzer)

Check the surface as well as the information underneath the surface

Searching for the cause of a non-uniformity in an electrode? If the target is a metal electrode filmed with another thin metal, understanding buried information such as data about thin film interfaces is also important. The SMM mode of an AFM helps you understand such buried information by measuring the uniformity of impedance distribution. Overlaying the buried information on the surface image may show you the cause of the problem.

Accurately evaluate in situ characteristics of low-resistance materials

Although conventional SMMs using DC or low-frequency signals are good for evaluating semiconductors, it’s impossible to evaluate the in situ characteristics of electrodes, which have little resistance and thus spread out the signals. To measure such low-resistance materials accurately, the signal needs to be high frequency, which makes the signal rather focused. Combining an AFM with a VNA that supports frequencies into the GHz range enables in situ characterization of electrodes.

Try Keysight’s proprietary method to seek new insights

For engineers trying to open up a new field, developing new materials and structures means also seeking new evaluation methods. Only Keysight, the world's No. 1*1 vendor of network analyzers, can offer an SMM environment with a combination of an AFM and a VNA. This new SMM environment will give you an opportunity for new insights unlike other methods and products

Basic model 6500 - Three AFM models are available to support SMM observation. The 6500 has a chamber that is capable of environmental controls.

Standard model 9500 - A chamber-type model with revolutionary new software and hardware. Capable of high-speed scanning, high-speed multi-point force mapping, and more.

Large-stage model 5600LS - All the performance of the Keysight 6500 but on a platform with a large travel stage. Suitable for observation of large samples.

Available to measure frequency characteristics up to 20 GHz - This VNA from the N52xxB PNA series accurately measures the frequency responses of specific areas even in low-resistance samples. You can also count on Keysight for signal calibration methods for observation systems.

Interpolate and quantify SMM data with electromagnetic analysis - The output from the FEM simulation in EMPro agrees well with that from SMM mode measurements,*2 and therefore the simulation can be used for the interpolation and quantitative explanation of measured data.