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Application Notes
Atomic force microscopy (AFM) was invented for high-resolution visualization of surface structures by profiling samples with a sharp probe. In this technique the tip-sample forces are applied for mapping of topography, and the use of tip forces was suggested for examination of local mechanical properties. The basic information about these interactions is obtained from force curves, which represent the dependence of the cantilever deflection on the tip–sample distance (DvZ) measured at a particular surface location. The measurement of force curves in AFM has a similarity with studies using a surface force apparatus and to recording of indentation curves with stylus indenters. Advantages of AFM probing of local mechanical properties are in studies of soft materials with low forces and in mapping of these properties with high spatial resolution. The latter capability became available with non-resonant oscillatory modes, such as Quick Sense mode implemented in Keysight 9500 scanning probe microscope. Important part of AFM nanomechanical measurements is the extraction of quantitative elastic modulus and work of adhesion of a sample from AFM force curves. This process is automated in QS mode, where it is performed on-line, simultaneously with recording the surface topography. In the following, we will provide a close look on analysis of force curves off-line in order to clarify several important issues of AFM nanomechanical studies.
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