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Atomic Force Microscopy with 9500 Scanning Probe Microscope

Application Notes

Developments in Scanning Probe Microscopy and, particularly, Atomic Force Microscopy (AFM) are related with the use of advanced electronics and fast data processing that become the essential features of contemporary microscopes. New instrumental AFM capabilities enhance surface imaging and quantitative studies of materials properties at micron and nanometer scales. A broad set of imaging modes, which includes non-resonant oscillatory Quick Sense (QS) technique, is implemented in the recently introduced Keysight 9500 microscope. In QS mode the intermittent tip-sample contact at frequency of 1-2 KHz leads to the probe bending to the set-point level, and the force curves are collected at this rate and applied for on-line calculations of local mechanical properties. Keysight 9500 microscope provides high-resolution visualization of surface structures, fast scanning, and quantitative measurements of local mechanical and electric properties. Some of these features are described below. Particularly, a complementary role of QS technique will be emphasized in measurements at different level of tip-sample forces. In addition to the large spectrum of applications Keysight 9500 microscope has unique environmental capability, which is not available in other commercial microscopes.

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