Column Control DTX

Optimizing Wireless Designs with Digital Demodulation and EVM

Application Notes

The test process for complete wireless systems, subsystems, and components is very complex. Ensuring successful testing from design optimization, troubleshooting, and validation through wireless standards compliance, in a way that is time- and cost-efficient, requires a comprehensive test approach. The most productive approach must combine quick and easy standards -compliance tests with more thorough analysis and troubleshooting. It should be more comprehensive and stringent than is required by the standards, allowing problems to be directly linked to their cause so that engineers can manage margins and yields in manufacturing. This application brief will discuss techniques for isolating problems and optimizing wireless designs using comprehensive, high performance modulation analysis and troubleshooting beyond pass/fail testing. We will also cover considerations for selecting measurement tools capable of performing this type of testing.

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Column Control DTX