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M8030A Multi-Channel BERT

Data Sheets

M8030A Multi-Channel BERT

The Keysight Technologies, Inc. M8030A multi-channel BERT provides a solution for J-BERT applications that require more than four channels. It supports up to 10 pattern generators and up to 10 analyzer channels for cases where multi-channel test applications, like PCIe®, passive optical network (PON) or ATE like applications are a must.

Due to the increasing complexity of devices and higher data rates, testing is more critical and complex. While single-lane testing might be sufficient at lower speeds, higher data rates increase the probability of crosstalk problems, making the use of multi-lane testing with different aggressor and victim signals more important. When multi-channel measurements are required in order to speed up throughput or test under real application conditions, the M8030A is the perfect tool.

M8020A modules

The M8030A multi-channel BERT is 100 percent compatible with available J-BERT M8020A modules. Its ability to support the M8041A and the M8051A J-BERT modules protects your existing module investment. The AXIe embedded controller is also supported and can be easily used along with M8041A/51A J-BERT modules to create an integrated and highly compact test environment. For more details on available configurations, please see the Configuration Guide section in this data sheet.

Applications

The M8030A multi-channel BERT is designed for R&D and test engineers characterizing and verifying compliance of chips, devices, boards, and systems with multiple I/O ports up to 16 Gb/s, which are used in various industry segments dealing with computer devices, communication equipment, and others. Typical applications include:

  • PCIe multi-channel tests
  • PON ATE test (when a low number of channels is sufficient)
  • 40GBASE and 100GBASE ports using 4 and 10 Gb/s ports

Features

  • Data rates up to 8.5 Gb/s and 16 Gb/s
  • Up to 10 BERT pattern generator and analyzer channels in a 14-slot AXIe chassis
  • Integrated and calibrated jitter injection: RJ, PJ1, PJ2, SJ, BUJ, sinusoidal level interference (common-mode and differential-mode), SSC (triangular and arbitrary, residual) and clock/2
  • Clock synchronization between all modules
  • 8 tap de-emphasis, positive and negative
  • Integrated jitter, de-emphasis and adjustable ISI, for each channel individually
  • Interactive link training for PCI Express®
  • Individually adjustable generator channel delay and pattern sequence
  • Built-in clock recovery and equalization
  • All options and modules are upgradeable

Benefits

  • Increases test efficiency with higher throughput when testing multiple channels simultaneously
  • Protects and leverages your investment in M8041A and M8051A modules by using them in J-BERT M8020A and M8030A BERT configurations
  • Keeps-up with your test needs by enabling the addition of modules and required options as needed
  • Ease of use by applying the same M8070B software for both, M8030A multi-channel BERT and J-BERT M8020A
  • Minimizes the number of signal degrading reflections resulting from high-speed switches in your test setup

M8000 Series of BER Test Solutions

Simplified, time-efficient testing is essential when you are developing next-generation computer, consumer, or communication devices.

The Keysight M8000 Series is a highly integrated BER test solution for physical layer characterization, validation, and compliance testing.

With support for a wide range of data rates and standards, the M8000 Series provides accurate, reliable results that accelerate your insight into the performance margins of high-speed digital devices.

M8030A Multi-Channel PCIe Receiver Test Application

The M8030A multi-channel BERT is a highly integrated receiver test system that can be configured for testing of up to 10 lanes, each with up to 16.2 Gb/s. Each pattern generator of the M8041A or M8051A module can be equipped with built-in impairments like timing jitter, amplitude interference, and channel emulation. It is the ideal solution for characterizing chipsets interfaces with multiple lanes or multiple ports.

Figure 2 shows an example of a characterization setup of a test chip with a PCI Express interface operating with a common reference clock. Each of the lanes can be stimulated and analyzed simultaneously. To emulate a real world scenario as closely as possible, each of the receiver ports can be stressed with independent jitter frequency and amplitude, allowing edges of neighboring channels to move throughout the victim’s eye. Measurements like jitter tolerance characterization can be executed on each lane independently.

Compared to serial BERT setups, the M8030A increases the test throughput.

The PCI test solution offers:

  • Up to eight PCI Express lanes that can be tested simultaneously
  • The ability to equip each PG with full stress capabilities, including channel loss emulation data rates 5 Gb/s and higher
  • Fully simulated crosstalk effects in each pattern generator by modulating with low frequency SJ
  • Setup recommendations for test chips, which can be forced into a test mode

M8030A PON Test Application

Passive optical networks (PON) are based on time division multiple access (TDMA) as used by GPON, BPON, EPON, and the emerging NG-PON. In this system, the most critical sub-module is the receiver RX of the optical line terminal (OLT) in the central office, which has to address the upstream signal bursts arriving from the optical network units (ONU) as shown in Figure 3. The timing of the bursted pattern on each channel, the control of the number of preamble bits, and timing of the required control signals are challenging.

Figure 3 shows a test setup consisting of an M8030A with M8041A and M8051A modules, Keysight’s Lightwave Measurement System (LMS) 8163B/8164B, and a digital communication analyzer (DCA-X) 81600D emulating the important portions of a PON. The exact timing capability for the two data bursts and the related laser control signals is essential for standard-compliant testing and characterization of the OLT’s receiver. The pattern sequencer allows the set-up and generation of the burst-packages with the desired content.

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