Column Control DTX

Testing WLAN Devices to IEEE 802.11 Standards

Application Notes

Wireless local area networking (WLAN) capabilities have been integrated into an increasing number of products: smartphones, digital cameras, printers, tablets, HDTVs, Blu-ray players and more. This trend has lead to a greater number of simultaneous connections to any given network in a home, school or business environment. Even though each individual connection may not require a high data rate, the cumulative demand results in higher requirements for total data throughput.

To keep pace with these trends, every new generation of the various IEEE 802.11 standards—a, b, g, n, and ac—supports increased data capacity by providing greater throughput and wider bandwidths. As the standards evolve, backward compatibility remains a fundamental requirement. For example, modulation techniques used in older standards, such as DSSS and FHSS, have carried forward into newer standards of OFDM and MIMO.

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Column Control DTX