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TS-5400 High Performance PXI Functional Test System with Mac Panel Interface

Data Sheets

Test Engineering Challenges

For automotive electronics manufacturers, industry-wide automotive trends are driving the need to improve test systems to address the growing complexity of automotive electronics and increasing volume demands: – Environment: Increasingly tighter worldwide government regulations regarding vehicle emissions are driving automotive manufacturers to achieve zero emissions. – Affordable cars: The introduction of more complex electronics into entry level cars with lower price points is resulting in higher market demand and volume for automotive electronics. – Quality: To reduce expensive vehicle recalls, automotive manufacturers and their suppliers are pursuing more comprehensive test coverage strategies to achieve zero-defect goals. With the introduction of more affordable cars into regions with high populations, automotive electronics manufacturing volumes are increasing. The confluence of these trends presents new challenges to automotive electronics manufacturers. They are faced with limited resources for capital equipment, finite factory floor space, and the push to reduce labor. So how do manufacturers improve test yields, maintain good test coverage for devices under test (DUT) that have increasing complexity and pin counts, and meet management goals for reducing the cost of test? In short, how do automotive electronics manufacturers balance their goals with three conflicting areas of cost, time, and scope of test (see Figure 1)? 

The Keysight Technologies, Inc. TS-5400 PXI Series automotive functional test system solves this dilemma by providing manufacturers with a global, PXI-based, standard platform that supports up to 464 test nodes, giving manufacturers the ability to test single or multiple DUTs simultaneously (see Figure 2). With this new configuration, customers are able to achieve a net throughput improvement of 30 percent compared to the earlier TS-5400 VXI-based platform. 

With significant throughput increases, manufacturers can also achieve lean manufacturing goals by reducing the number of testers, production operators, and floor space requirements (see Figure 3).

With a built-in thermal and airflow management system, the lifespan of the Keysight TS-5400 PXI Series functional test system is extended, improving the manufacturer’s return on invested capital via more efficient testing (see Figures 4 and 5). 

The improved user accessibility and ergonomics of the PXI instrument access panel (Figure 4, item 4), PXI mainframe mounting kit (Figure 4, item 5) and power distribution module (Figure 4, item 6) simplifies the test engineers’ user experience and shortens the time needed for them to make system configuration changes and provide support. 

Four base platforms test the range of automotive ECMs. From simple ECMs like climate control, immobilizers, and remote keyless entry (RKE), to safety ECMs like airbag and ABS/ TC, and complex ECMs like engine management systems, the TS-5400 PXI Series provides the price and performance required. 

These platforms are tuned for functional test of automotive electronics and consist of measurement resources, switching, a test executive, and automotive-tuned library routines. Racking, cabling, and optional fixturing are included, as well as standard software development tools, which enable test engineers to deploy test systems up to three times faster than building test systems from individual components. 

Just Enough Test 

With the growth in convenience and safety ECMs, test engineering needs to meet production throughput goals while maintaining a competitive cost of test for today’s market and in the future. The unique architecture of the TS-5400 PXI Series lets you purchase “just enough test” resources to meet current ECM test requirements, and allows you to add test capabilities to the system when new ECMs move into production.

Throughput Multiplier

The throughput multiplier test strategy (multiple-up UUT testing) is one way to increase throughput in a manufacturing environment. Multiple-up UUT testing consolidates tasks common to multiple modules, such as load/unload, instrument signal set up, and load routing. It is also an effective strategy for overlapping inherent latencies in the UUT or test system (see Figure 6).

UUT-Assisted Test

As shown in Figure 7, most ECM designs include a serial interface. Communication protocols vary by manufacturer, but most comply with OBD2 standards. Alternative communication protocols supported by manufacturers include ISO-9141, J1939/CAN, and J1850. The serial link is used in the automobile itself and can also assist in the testing of the module. As a programmable device, the ECM can be loaded with either operational code or test code. Operational code is present in the ROM during testing, or it is downloaded when the unit is shipped. Test code is either included in the ROM or downloaded through the serial link into the module. By using test code as part of the test program, the TS-5400 PXI Series establishes a set of conditions to which the ECM responds. This test approach is called UUT-assisted test. 

The TS-5400 PXI Series enables three different modes for performing UUT-assisted test. The best choice of mode depends on the test stimulus source and response destination. 

  • Serial Link Evaluation: This mode simply evaluates the serial link and microcontroller. Commands sent to the microcontroller over the serial link prompt a response that is sent back to the test system. The system then veriies the response and may perform a full CRC memory check. Parametric tests may also be run to test serial link characteristics such as delay, rise or fall time, and input impedance.
  • I/O Status Evaluation: This mode uses the test system I/O to determine ECM input states. It does this by sending a message over the serial link to the ECM, prompting it to run a test routine. For example, this mode may be used to apply an analog input to the ECM to verify A/D conversion and the module’s handling and communication of data over the serial link. (For example, the analog input may be a simulation of a sensor’s output for air or water temperature, the throttle position indicator (TPI), manifold air pressure (MAP) and the like.) In this mode, the test system can use UUT-assisted testing to assess proper functioning of several functions at once, including the controller, serial link, A/D and waveform processing circuitry.
  • Input Evaluation: In this mode, the test system supplies an input then reads the value at either the input or output of the module. For example, this would include dynamic tests such as the application of a cam/crank phase synchronous waveform (MAP or TPI input). The evaluation can verify proper receipt of the signal at the module input or if the input caused the appropriate output.

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