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LTE Base Station (eNB) Transmitter and Component Test

Technical Overviews

Introduction

This document describes how to evaluate key product features through demonstration and is not intended to be a User’s Guide. Prior knowl­edge of the Keysight Technologies, Inc. products mentioned in the document is not required for these demonstrations and step-by-step instructions are provided. Please reference the appropriate Keysight User and Measurement Guides for further information regarding product operation.

The demonstrations found within this document assume basic knowl­edge of LTE physical layer signal characteristics.

Demonstration Preparation

Equipment requirements

Upgrade to the latest firmware

The following instruments and software are required to perform all the demonstra­tions found in this guide. Note that X-Series signal analyzers differ in performance and measurement results may vary. It is strongly recommended to update instru­ment firmware and software to the latest versions.

Component Test Demonstrations

Single-carrier adjacent channel leakage ratio (ACLR)

Introduction

Adjacent channel leakage ratio (ACLR) is a key transmitter 3GPP conformance test and an important power amplifier (PA) performance metric since this component is the main con­tributor of distortion in the transmit chain. The use of OFDMA for the downlink in LTE results in a signal with high peak-to-average power ratios (PAPR) (i.e. crest factor), which is a result of the independent phases of the multiple subcarriers adding constructively. This extremely stressful signal requires a PA with a large dynamic range, which presents very difficult chal­lenges to PA designers. As a result, the signal generator and signal analyzer used during the design and characterization of the PA must have significantly better distortion peformance than the PA under test in order to minimize any uncertainity in the results.

Single carrier measurement demonstration objectives

1. Create a test signal configured for an E-UTRA test model (E-TM) using Signal Studio for 3GPP LTE software

2. Measure single carrier ACLR performance of the MXG vector signal generator using an X-Series signal analyzer with the LTE measurement application

3. Measure single carrier ACLR performance of MXG vector signal generator at higher power

Quickly create error-free test model configurations

eNB transmitter conformance tests are carried out using downlink configurations known as E-UTRA test models (E-TM). These are highly complex signals due to the flexible nature of the LTE downlink OFDMA modulation scheme. Therefore, a large number of parameters need to be fully defined, which increases the chance of errors during setup. Signal Studio software eliminates this uncertainty and deceases setup time by provid­ing:

  • Predefined setups for all three classes of E-UTRA test models (E-TM)
  • Easy tree-style navigation for testing beyond standard requirements with user-defined signal configurations
  • 3GPP LTE compliant signals with a first-to-market track record for updates
  • Calculated CCDF graphs to investigate the effect of power ramps, modulation formats, power changes, clipping, etc.
  • Comprehensive set of online documentation and embedded help

Industry best ACLR and output power performance

With the industry's best combination of high output power and distortion performance, the MXG RF vector signal generator is ideal for PA and multicarrier power amplifier (MCPA) design and production engineers who want to minimize measurement uncer­tainty for accurate design characterization and improved yields.

  • 74 dBc (measured) ACLR performance for a 5 MHz LTE FDD single carrier
  • Up to +23 dBm (specified) output power up to 3 GHz with electronic attenuator
  • ≤ 1.2 ms switching speed (SCPI mode); ≤ 900 μs simultaneous frequency, amplitude, and waveform switching (List mode)

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