Column Control DTX

Reducing Measurement Times in Antenna and RCS Applications

Application Notes

In today’s most advanced antennas, enhanced performance goes hand-in-hand with greater complexity—and this leads to increasingly challenging test requirements. At the same time, concerns about organizational competitiveness and time-to-market are driving the need to reduce the total cost of test. These conflicting forces can put tremendous strain on the entire test function: personnel, resources and facilities.

 

Fortunately, measurement technology is improving in ways that can relieve the strain. When properly applied, these advances can help shorten total test times, reduce the cost of test, improve test range productivity and increase manufacturer competitiveness.

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Column Control DTX