In-Circuit Test for Network Parameter Measurement

Application Notes

This paper describes how to get the most from Network Parameter Measurement (NPM) capability on the Keysight Technologies, Inc. Medalist i3070 in-circuit test (ICT) system using enhancements in software version 7.20p. It is targeted at critical elements for NPM success. For general NPM and VTEP guidelines, refer to the white paper “Maximising Test Coverage with Keysight Medalist VTEP v2.0” found at www.keysight.com/see/vtep

NPM is a sensitive measurement requiring much greater care in ixturing and development than standard VTEP.

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In-Circuit Test for Network Parameter Measurement

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