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Atomic Force Microscopy (AFM) for Particle Characterization

Application Notes

Particles, especially nanoparticles are of great scientific interest because their properties change as the size approaches the nanoscale. The properties include optical, magnetical, mechanical, electronic and thermal property etc. Due to this unique feature, nanoparticles not only attract much attention from the scientific community but also are becoming more and more important in practical applications such as coatings, data storage, catalyst and nanoelectronics. Nanoparticle characterization is a key step to understand nanoparticle’s properties and to control the manufacturing and applications. Normally nanoparticle characterization especially sizing, is done by a variety of methods such as light scatter methods, sedimentation methods, electrical property method and imaging methods. Except the imaging method, all methods measure particle sizes indirectly, since the size is interpreted based on a model or a theory from some measured parameters. Among the imaging techniques, optical microscopy, electron microscopy and scanning probe microscopy are the main techniques. Optical microscopy can only be applied to measure particles with a size larger than one micron. Electron microscopy can measure particles down to nanometer size in vacuum conditions, while the sample preparation is complicated.

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